Patents by Inventor Bernard Drevillon

Bernard Drevillon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9366694
    Abstract: A multimode local probe microscope having a resonator, a first electrode, and a second electrode, an excitation source adapted to generate mechanical resonance in the resonator, a metal tip fastened to the resonator, movement mechanism for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes. The metal tip is electrically connected to the output second electrode and the microscopy apparatus includes amplifier and filter for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and configured for regulating the distance Z between the end of the tip and the surface of the sample.
    Type: Grant
    Filed: January 13, 2014
    Date of Patent: June 14, 2016
    Assignees: Ecole Polytechnique, Centre National de la Recherche Scientifique
    Inventors: Marc Chaigneau, Akli Karar, Bernard Drevillon, Razvigor Ossikovski
  • Publication number: 20160003866
    Abstract: The present invention relates to a multimode local probe microscope having a resonator (1), a first electrode (9), and a second electrode (8), an excitation source adapted to generate mechanical resonance in the resonator, a metal tip (4) fastened to the resonator, movement means for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector means for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said output second electrode (9) and the microscopy apparatus includes amplifier and filter means for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and means for regulating the distance Z between the end of the tip and the surface of the sample.
    Type: Application
    Filed: January 13, 2014
    Publication date: January 7, 2016
    Inventors: Marc Chaigneau, Akli Karar, Bernard Drevillon, Razvigor Ossikovski
  • Patent number: 8405830
    Abstract: A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N?n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.
    Type: Grant
    Filed: October 28, 2009
    Date of Patent: March 26, 2013
    Assignees: HORIBA Jobin Yvon SAS, Centre National de la Recherche Scientifique, Ecole Polytechnique
    Inventors: Denis Cattelan, Enric Garcia-Caurel, Antonello De Martino, Bernard Drevillon
  • Patent number: 8214024
    Abstract: An electronic polarimetric imaging system for a colposcopy device designed for in vivo observation of a cervix, wherein the colposcopy device includes a light source for illuminating the observable cervix and at least visual elements for monitoring an image of the cervix, the illumination optical path towards the cervix and the image optical path coming back from the cervix being separated from one another over at least one portion of the paths thereof. The system includes a polarimetric adapter housing which is removable into the separated portion of the illumination and image optical paths, the polarimetric adapter housing including a polarisation state generator (PSG) on the illumination optical path and a polarisation analyser (PSA) on the image optical path, wherein the polarisation state generator (PSG) and the polarisation analyser (PSA) are controllable. Several levels of polarimetric characterisation are possible. An adaptor housing is also disclosed.
    Type: Grant
    Filed: June 27, 2006
    Date of Patent: July 3, 2012
    Assignees: Ecole Polytechnique, Assistance Publique-Hopitaux de Paris, Institut Mutualiste Montsouris
    Inventors: Antonello De Martino, Bernard Drevillon, Laurent Schwartz, André Nazac, Bernard Huynh
  • Publication number: 20110205539
    Abstract: A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N?n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.
    Type: Application
    Filed: October 28, 2009
    Publication date: August 25, 2011
    Applicants: HORIBA JOBIN YVON SAS, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE POLYTECHNIQUE
    Inventors: Denis Cattelan, Enric Garcia-Cautel, Antonello De Martino, Bernard Drevillon
  • Patent number: 7863113
    Abstract: A transistor for active matrix display and a method for producing the transistor (1). The transistor (1) includes a microcrystalline silicon film (5) and an insulator (3). The crystalline fraction of the microcrystalline silicon film (5) is above 80%. According to the invention, the transistor (1) includes a plasma treated interface (4) located between the insulator (3) and the microcrystalline silicon film (5) so that the transistor (1) has a linear mobility equal or superior to 1.5 cm2V?1s?1, shows threshold voltage stability and wherein the microcrystalline silicon film (5) includes grains (6) whose size ranges between 10 nm and 400 nm. The invention concerns as well a display unit having a line-column matrix of pixels that are actively addressed, each pixel comprising at least a transistor as described above.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: January 4, 2011
    Assignees: Centre National de la Recherche Scientifique, Ecole Polytechnique
    Inventors: Pere Roca I Cabarrocas, Régis Vanderhaghen, Bernard Drevillon
  • Patent number: 7859661
    Abstract: A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.
    Type: Grant
    Filed: January 19, 2007
    Date of Patent: December 28, 2010
    Assignees: Ecole Polytechnique, Centre National de la Recherche Scientifique
    Inventors: Razvigor Ossikovski, Antonello De Martino, Bernard Drevillon
  • Patent number: 7777880
    Abstract: Method and a polarimetric measurement device of a planar object carrying patterns repeated regularly and forming the lines of a grid. A first measurement is carried out at zero order, under an angle of incidence ?1 and for a first azimuthal angle ?1, a second measurement at least is carried out at zero order, under an angle of incidence ?2 and for a second azimuthal angle ?2, the polarization of the incident beam is modulated and the polarization of the reflected beam is analyzed for each measurement, theoretical polarimetric data is calculated for a model object of the real object, the model object including parameters adjustable using a formalism of electromagnetism. An iterative comparison of the measurements is conducted with the theoretical polarimetric data for different values of the adjustable parameters.
    Type: Grant
    Filed: December 22, 2005
    Date of Patent: August 17, 2010
    Assignees: Ecole Polytechnique, Centre National de la Recherche Scientifique - CNRS
    Inventors: Antonello De Martino, Bernard Drevillon
  • Patent number: 7713779
    Abstract: The invention concerns a photoactive nanocomposite (3) comprising at least one donor-acceptor couple of semiconductor elements. One of the elements is made of doped nanowires (7) with sp3 structure, and the other of the elements is an organic compound (8). The elements are supported by a device substrate (1). The invention also concerns a production method. According to a first embodiment, after their growth, the nanowires (7) are retrieved, functionalised and solubilised in the organic component (8). The mixture is deposited by coating on a device substrate. According to a second embodiment, the nanowires (7) are formed on a growth substrate (5) which is also the device substrate. The organic component (8) is combined with the nanowires (7) so as to form an active layer (3). Such a photoactive nanocomposite (3) allows production of a photovoltaic cell.
    Type: Grant
    Filed: July 21, 2005
    Date of Patent: May 11, 2010
    Assignees: Commissariat a l'Energie Atomique, Ecole Polytechnique, Centre National de la Recherche Scientifique
    Inventors: Muriel Firon, Bernard Drevillon, Anna Fontcuberta I Morral, Serge Palacin, Pere Roca i Cabarrocas
  • Publication number: 20100074807
    Abstract: An apparatus for generating a plasma includes a vacuum chamber having a wall and a plasma source including one or more devices for exciting the plasma, and elements for generating a constant magnetic field around the plasma to couple microwave energy into plasma at electron cyclotron resonance, each of the devices for exciting the plasma including a coaxial microwave connector able to be connected to a microwave energy source and a loop antenna able to emit a microwave energy for exciting the plasma. The loop antenna of the one or more devices is positioned inside the vacuum chamber in order to be in contact with the plasma and the elements for generating a constant magnetic field include at least two magnetic dipoles placed on the wall of the vacuum chamber, each of the one or more devices for exciting the plasma having the two magnetic dipoles placed on both sides.
    Type: Application
    Filed: March 21, 2008
    Publication date: March 25, 2010
    Applicants: ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Pavel Bulkin, Bernard Drevillon
  • Publication number: 20080304061
    Abstract: A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.
    Type: Application
    Filed: January 19, 2007
    Publication date: December 11, 2008
    Applicants: ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Razvigor Ossikovski, Antonello De Martino, Bernard Drevillon
  • Publication number: 20080200817
    Abstract: The invention relates to an electronic polarimetric imaging system use in a colposcopy device for in vivo monitoring a cervix, which is provided with a light source for illuminating the observable cervix and at least visual means for monitoring said cervix, wherein the illumination optical path directed to the cervix and the image optical path coming back from the cervix are separated from each other on at least a portion of the paths thereof. The inventive system comprises a polarimetric adapter housing which is removable in the separated portion of the illumination and image optical paths and comprises a polarization state generator (PSG) positioned on the illumination optical path and a polarization analyser (PSA) positioned on the image optical path, wherein said polarization state generator (PSG) and polarization analyser (PSA) are designed in such a way that they are controllable. Said invention makes it possible to obtain several polarimetric characterisation levels.
    Type: Application
    Filed: June 27, 2006
    Publication date: August 21, 2008
    Applicants: ECOLE POLYTECHNIQUE, INSTITUT MUTUALISTE MONTSOURIS, ASSISTANCE PUBLIQUE - HOPITAUX DE PARIS
    Inventors: Antonello De Martino, Bernard Drevillon, Laurent Schwartz, Andre Nazac, Bernard Huynh
  • Publication number: 20070290197
    Abstract: The invention concerns a photoactive nanocomposite (3) comprising at least one donor-acceptor couple of semiconductor elements. One of the elements is made of doped nanowires (7) with sp3 structure, and the other of the elements is an organic compound (8). The elements are supported by a device substrate (1). The invention also concerns a production method. According to a first embodiment, after their growth, the nanowires (7) are retrieved, functionalised and solubilised in the organic component (8). The mixture is deposited by coating on a device substrate. According to a second embodiment, the nanowires (7) are formed on a growth substrate (5) which is also the device substrate. The organic component (8) is combined with the nanowires (7) so as to form an active layer (3). Such a photoactive nanocomposite (3) allows production of a photovoltaic cell.
    Type: Application
    Filed: July 21, 2005
    Publication date: December 20, 2007
    Inventors: Muriel Firon, Bernard Drevillon, Anna Fontcuberta I Morral, Serge Palacin, Pere Roca I Cabarrocas
  • Patent number: 7298480
    Abstract: A broadband ellipsometer/polarimeter system for analyzing a sample includes an illumination source emitting a polychromatic light beam, a polarization state generator (PSG) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a sample holder, a polarization state analyser (PSA) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a primary detection system measuring the intensities at each wavelength of the light beam transmitted through the PSA, optics to collimate the beam into the PSG and into the PSA and to focus the beam into the sample surface and the detector. The linear polarizer and achromatic retarder in the PSA are identical to those of the PSG but mounted in a reverse order.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: November 20, 2007
    Assignee: Ecole Polytechnique
    Inventors: Enric Garcia-Caurel, Antonello De Martino, Bernard Drevillon
  • Publication number: 20070263219
    Abstract: Method and a polarimetric measurement device of a planar object carrying patterns repeated regularly and forming the lines of a grid. A first measurement is carried out at zero order, under an angle of incidence ?1 and for a first azimuthal angle ?1, a second measurement at least is carried out at zero order, under an angle of incidence ?2 and for a second azimuthal angle ?2, the polarization of the incident beam is modulated and the polarization of the reflected beam is analyzed for each measurement, theoretical polarimetric data is calculated for a model object of the real object, the model object including parameters adjustable using a formalism of electromagnetism. An iterative comparison of the measurements is conducted with the theoretical polarimetric data for different values of the adjustable parameters.
    Type: Application
    Filed: December 22, 2005
    Publication date: November 15, 2007
    Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Antonello De Martino, Bernard Drevillon
  • Publication number: 20070146706
    Abstract: The present invention concerns a broadband ellipsometer/polarimeter system for analysing a sample (8) comprising an illumination source (5) emitting a polychromatic light beam (12), a polarisation state generator (PSG) (6) including a fixed linear polarizer (13) and a substantially achromatic retarder (21) mounted on a rotating holder (14), a sample holder (3), a polarisation state analyser (PSA) (10) including a fixed linear polarizer (20) and a substantially achromatic retarder (22) mounted on a rotating holder (19), a primary detection system (11) measuring the intensities at each wavelength of the light beam transmitted through said PSA (10), optics to collimate the beam into the PSG (6) and into the PSA (10) and to focus the beam into the sample surface (8) and the detector (11).
    Type: Application
    Filed: December 23, 2005
    Publication date: June 28, 2007
    Inventors: Enric Garcia-Caurel, Antonello De Martino, Bernard Drevillon
  • Publication number: 20070091030
    Abstract: An electronic control cell for at least one organic light-emitting diode (OLED) of a pixel or segment of an active matrix display, the cell including at least one control circuit (6,61,62) with a control input and operating relative to a control signal arriving at a control line (5,5?) and enabling to turn the OLED(s) on, one capacitive storage circuit of the control signal with a capacitor C connected to the control line, one selection circuit (4,41,42) operating relative to a selection signal Vsel on a selection line (3,3?) and enabling electrical connection or insulation of the capacitive storage circuit with/from a control voltage Vcom (2) relative to the selection signal. The storage is temporary by discharging the capacitor through a resistor Rf parallel to the capacitor. Operating methods and a display unit are also disclosed.
    Type: Application
    Filed: December 13, 2004
    Publication date: April 26, 2007
    Applicants: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE POLYTECHNIQUE
    Inventors: Bernard Drevillon, Francois Anceau, Yvan Bonnassieux, Regis Vanderhaghen
  • Patent number: 7196792
    Abstract: A liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process intended for measuring the representative parameters of a sample in which the polarimetric system contains an excitation section emitting a light beam that passes through a polarization state generator (PSG) and onto a sample. After reflection or transmission by the sample, the beam goes through an analysis section with a polarization state detector (PSD). The PSG and PSD each have a first and a second liquid crystal elements LCj (j=1,2) having, for each LCj element of the PSG (respectively for each LCj element of the PSD), an extraordinary axis making an angle ?j (resp. ??j) with respect to the polarization direction (i), and a retardation ?j (resp (??j) between its ordinary and extraordinary axes, the liquid crystals LCj elements being positioned in reverse order in the PSD with respect to the LCj elements of the PSG.
    Type: Grant
    Filed: October 15, 2003
    Date of Patent: March 27, 2007
    Assignees: Centre National de la Recherche Scientifique (CNRS), Ecole Polytechnique
    Inventors: Bernard Drevillon, Antonello De Martino
  • Publication number: 20060240602
    Abstract: A transistor for active matrix display and a method for producing the transistor (1). The transistor (1) includes a microcrystalline silicon film (5) and an insulator (3). The crystalline fraction of the microcrystalline silicon film (5) is above 80%. According to the invention, the transistor (1) includes a plasma treated interface (4) located between the insulator (3) and the microcrystalline silicon film (5) so that the transistor (1) has a linear mobility equal or superior to 1.5 cm2V?1s?1, shows threshold voltage stability and wherein the microcrystalline silicon film (5) includes grains (6) whose size ranges between 10 nm and 400 nm. The invention concerns as well a display unit having a line-column matrix of pixels that are actively addressed, each pixel comprising at least a transistor as described above.
    Type: Application
    Filed: February 6, 2004
    Publication date: October 26, 2006
    Inventors: Pere Roca I Cabarrocas, Regis Vanderhaghen, Bernard Drevillon
  • Patent number: 7046379
    Abstract: A method for characterizing or controlling the production of a thin-layered component using optical methods. Acquired signals S1 and S2 are processed in order to obtain parameters x, ? of the deposited layers. The stacking is represented by the product of two Abeles matrices for each direction of polarization s (perpendicular to the incidence plane) and p (parallel to the incidence plane): a known matrix Mos,p representing the support and matrix dMs,p representing a thin transparent layer being deposited.
    Type: Grant
    Filed: January 31, 2002
    Date of Patent: May 16, 2006
    Assignees: Centre National de la Recherche Scientifique (C.N.R.S.), Jobin Yvon S.A.
    Inventors: Alfred Hofrichter, Bernard Drevillon, Dmitri Kouznetsov