Patents by Inventor Bernd Bodermann

Bernd Bodermann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor
    Patent number: 7420689
    Abstract: The aim of the invention is to determine the refractive index and/or compensation of the influence of the refractive index during interferometric length measurement with the aid of an interferometer (13, 13?) impinged upon by at least two measuring beams (v2, v3) having at least defined frequencies with an approximately harmonic ratio. Interferometric phases are evaluated for the at least two measuring beams (v2, v3) at the outlet of said interferometer. The interferometric phases corresponding to the harmonic ratio of the frequencies of the measuring beams (v2, v3) are multiplicated and at least one phase difference of the thus formed phase value is examined.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: September 2, 2008
    Assignee: Bundesrepublik Deutschland, vertr. durch das Bundesministerium fur Wirtschaft und Technologie, dieses vertreten durch den Prasidenten der Physikalisch-Technischen Bundesanstalt
    Inventor: Bernd Bodermann
  • Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor
    Publication number: 20070024859
    Abstract: The aim of the invention is to determine the refractive index and/or compensation of the influence of the refractive index during interferometric length measurement with the aid of an interferometer (13, 13?) impinged upon by at least two measuring beams (V2, V3) having at least defined frequencies with an approximately harmonic ratio. Interferometric phases are evaluated for the at least two measuring beams (V2, V3) at the outlet of said interferometer. The interferometric phases corresponding to the harmonic ratio of the frequencies of the measuring beams (V2, V3) are multiplicated and at least one phase difference of the thus formed phase value is examined.
    Type: Application
    Filed: June 24, 2004
    Publication date: February 1, 2007
    Inventor: Bernd Bodermann