Patents by Inventor Bernd Jungmann

Bernd Jungmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting defects by three-way die-to-die comparison with false majority determination
    Patent number: 7657077
    Abstract: A method of determining defects in a plurality of images having essentially the same image contents is disclosed. A comparison operation is carried out once three fully comparable images having essentially the same image contents are present in the intermediate memory. The stored individual images are accessed randomly. A paired comparison operation between the three difference images is carried out.
    Type: Grant
    Filed: February 28, 2006
    Date of Patent: February 2, 2010
    Assignee: Vistec Semiconductor Systems GmbH
    Inventors: Detlef Michelsson, Steffen Gerlach, Bernd Jungmann
  • Method for detecting defects in images
    Publication number: 20060204109
    Abstract: A method of determining defects in a plurality of images having essentially the same image contents is disclosed. A comparison operation is carried out once three fully comparable images having essentially the same image contents are present in the intermediate memory. The stored individual images are accessed randomly. A paired comparison operation between the three difference images is carried out.
    Type: Application
    Filed: February 28, 2006
    Publication date: September 14, 2006
    Applicant: Leica Microsystems Semiconductor GmbH
    Inventors: Detlef Michelsson, Steffen Gerlach, Bernd Jungmann
  • Method for defect segmentation in features on semiconductor substrates
    Publication number: 20050008217
    Abstract: A method for defect segmentation in features on semiconductor substrates is disclosed. After acquisition of an image of a semiconductor substrate, identical features or feature elements are subtracted from one another. The resulting difference function is compared with an upper and a lower threshold in order to identify defects.
    Type: Application
    Filed: July 6, 2004
    Publication date: January 13, 2005
    Inventors: Thin Luu, Bernd Jungmann, Detlef Michelsson