Patents by Inventor Bernd Marler

Bernd Marler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080000354
    Abstract: The present invention relates to a tectosilicate having an X-ray diffraction pattern in which at least the following reflections occur: Intensity (%) Diffraction angle 2?/° [Cu K(alpha 1)] 100 ?9.8-10.2 24-34 11.0-11.4 ?9-19 15.5-15.9 12-22 19.4-19.6 19-29 19.6-19.8 100% relating to the intensity of the maximum peak in the X-ray diffraction pattern.
    Type: Application
    Filed: April 13, 2005
    Publication date: January 3, 2008
    Applicants: BASF Aktiengesellschaft, Rubitec GmbH
    Inventors: Ulrich Muller, Gerald Lippert, James Brown, Hermann Gies, Bernd Marler, Nadine Stroter, Yingxia Wang
  • Patent number: 5614166
    Abstract: A crystalline solid comprising a boro-, alumino-, gallo-, titano-, vanado- or zincosilicate or a mixture thereof having the RUB-13 structure, which has a monoclinic space group and exhibits an X-ray diffraction pattern in which at least the following reflections (hkl) occur at the stated diffraction angles:______________________________________ h k l Intensity I/I.sub.o d-spacings (d.sub.hkl) ______________________________________ 0 2 0 very strong 10.26 0 1 1 very strong 9.79 -1 3 1 weak 4.98 0 4 1 medium 4.53 -2 0 1 medium 4.52 -1 1 2 medium 4.46 ______________________________________and their uses.
    Type: Grant
    Filed: July 10, 1995
    Date of Patent: March 25, 1997
    Assignee: BASF Aktiengesellschaft
    Inventors: Hermann Gies, Silke Vortmann, Bernd Marler, Ulrich Muller, Uwe Dingerdissen