Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Abstract: The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: The test needle comprises, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion opposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiflingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.