Patents by Inventor Bernd Schindler

Bernd Schindler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240162205
    Abstract: A power semiconductor package comprises a leadframe comprising a first die pad, a second die pad and a plurality of external contacts. The first and second die pads are separated by a first gap. A power semiconductor die is arranged on and electrically coupled to a first side of the first die pad. A diode is arranged on and electrically coupled to a first side of the second die pad. A molded body encapsulates the power semiconductor die and the diode, the molded body having a first side, an opposite second side and lateral sides connecting the first and second sides. A second side of the first die pad is exposed from the second side of the molded body. A second side of the second die pad is completely covered by an electrically insulating material.
    Type: Application
    Filed: November 10, 2023
    Publication date: May 16, 2024
    Applicant: Infineon Technologies Austria AG
    Inventors: Marcus BÖHM, Stefan WÖTZEL, Andreas GRASSMANN, Bernd SCHMOELZER, Uwe SCHINDLER
  • Patent number: 11170970
    Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: November 9, 2021
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
  • Patent number: 10274441
    Abstract: Generating an image of an object and/or a representation of data about the object uses a particle beam apparatus. The particle beam apparatus comprises at least one control unit for setting a guide unit by selecting a value of a control parameter of the control unit. A functional relationship is determined between a first control parameter value and a second control parameter value depending on the predeterminable range of a landing energy of the particles. A desired value of the landing energy is set. The value of the control parameter corresponding to the desired value of the landing energy is selected on the basis of the determined functional relationship and the guide unit is controlled using the value of the control parameter corresponding to the desired value of the landing energy.
    Type: Grant
    Filed: May 22, 2017
    Date of Patent: April 30, 2019
    Assignee: CARL ZEISS MICROSCOPY GMBH
    Inventors: Christian Hendrich, Bernd Schindler
  • Publication number: 20190035601
    Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.
    Type: Application
    Filed: August 21, 2018
    Publication date: January 31, 2019
    Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
  • Patent number: 10068747
    Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: September 4, 2018
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
  • Publication number: 20170336335
    Abstract: Generating an image of an object and/or a representation of data about the object uses a particle beam apparatus. The particle beam apparatus comprises at least one control unit for setting a guide unit by selecting a value of a control parameter of the control unit. A functional relationship is determined between a first control parameter value and a second control parameter value depending on the predeterminable range of a landing energy of the particles. A desired value of the landing energy is set. The value of the control parameter corresponding to the desired value of the landing energy is selected on the basis of the determined functional relationship and the guide unit is controlled using the value of the control parameter corresponding to the desired value of the landing energy.
    Type: Application
    Filed: May 22, 2017
    Publication date: November 23, 2017
    Inventors: Christian Hendrich, Bernd Schindler
  • Publication number: 20170062180
    Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.
    Type: Application
    Filed: August 31, 2016
    Publication date: March 2, 2017
    Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
  • Publication number: 20130256558
    Abstract: An apparatus for contaminants being deposited thereon in a particle beam device, and also the particle beam device including the apparatus, are provided. This apparatus may be an anticontaminator. The apparatus according to the system described herein may include at least one cooling unit. The cooling unit may provide at least one cooled surface on which contaminants in a particle beam device are deposited. The apparatus according to the system described herein may further include at least one aperture unit. The aperture unit may be arranged at a motion device for moving the aperture unit relative to the cooling unit. Furthermore, the aperture unit may have at least one aperture opening. The cooling unit may be connected to the aperture unit by at least one first flexible thermal conductor.
    Type: Application
    Filed: March 29, 2012
    Publication date: October 3, 2013
    Inventors: Christian DIETL, Gerald SCHMID, Bernd SCHINDLER, Gerd BENNER, Thilo MANDLER, Marco MATIJEVIC
  • Patent number: 7868050
    Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: January 11, 2011
    Inventors: Bernd Schindler, Richard McDonogh
  • Patent number: 7160927
    Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: January 9, 2007
    Inventors: Bernd Schindler, Richard McDonogh
  • Publication number: 20060276602
    Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.
    Type: Application
    Filed: August 10, 2006
    Publication date: December 7, 2006
    Inventors: Bernd Schindler, Richard McDonogh
  • Patent number: 6815678
    Abstract: The invention relates to a raster electron microscope having a specimen chamber and a detector for electrons mounted in the specimen chamber. The raster electron microscope also includes a specimen table having a specimen holder and the specimen table is mounted in the specimen chamber. A diaphragm system is provided on the specimen table and has a diaphragm between the specimen holder and the detector. The diaphragm system is adjustable relative to the specimen holder. The invention can be configured especially as an ancillary module which is accommodated on the specimen table of a conventional raster electron microscope. The system of raster electron microscope and ancillary unit serves for generating special contrastings, especially a dark-field contrast in transmission.
    Type: Grant
    Filed: March 18, 2003
    Date of Patent: November 9, 2004
    Assignee: LEO Elektronemikroskopie GmbH
    Inventors: Ute Golla-Schindler, Bernd Schindler
  • Publication number: 20040054125
    Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.
    Type: Application
    Filed: September 17, 2003
    Publication date: March 18, 2004
    Inventors: Bernd Schindler, Richard McDonogh
  • Publication number: 20030230713
    Abstract: The invention relates to a raster electron microscope having a specimen chamber and a detector for electrons mounted in the specimen chamber. The raster electron microscope also includes a specimen table having a specimen holder and the specimen table is mounted in the specimen chamber. A diaphragm system is provided on the specimen table and has a diaphragm between the specimen holder and the detector. The diaphragm system is adjustable relative to the specimen holder. The invention can be configured especially as an ancillary module which is accommodated on the specimen table of a conventional raster electron microscope. The system of raster electron microscope and ancillary unit serves for generating special contrastings, especially a dark-field contrast in transmission.
    Type: Application
    Filed: March 18, 2003
    Publication date: December 18, 2003
    Inventors: Ute Golla-Schindler, Bernd Schindler
  • Patent number: 4840636
    Abstract: A stream of gas is forced through the pores of an object and either the gas itself or a component thereof is electrically activated through partial brush discharge such that reaction products will modify the surface of the pore walls as the gas flows through. The method avoids vacuum deposition methods as well as wet-coating methods and is applicable for either hydrophobizing or hydrophilizing objects and for improving, for example, biochemical activities or compatability of the object with a liquid to be filtered later.
    Type: Grant
    Filed: October 9, 1984
    Date of Patent: June 20, 1989
    Assignee: Fraunhofer Geselschaft E.V.
    Inventors: Herbert Bauser, Bernd Schindler, Horst Chmiel
  • Patent number: 4495232
    Abstract: A stamping foil for forming printed circuit patterns on insulating or poorly conductive substrates comprising an electrically conductive layer made of a highly conductive metal, such as copper, which is endowed with a sufficiently low shear strength, even in thicknesses of 10 microns or more, to permit easy and sharp separation of the activated (imprinted) and non-activated portions of the foil. Such a low shear strength may be achieved with fibrous or fibrous-granular crystallite structures, wherein the fibers are oriented approximately at right angles to the surfaces of the foil, and, in addition, by doping agents containing carbon, nitrogen and sulfur. The foil may comprise a bonding layer for bonding the conductive layer to a substrate, or such a bonding layer may be applied to the surface of the conductive layer before the stamping operation. The conductive layer may be either self-supporting, or it may adhere to a carrier tape through an intermediary separating layer.
    Type: Grant
    Filed: March 29, 1982
    Date of Patent: January 22, 1985
    Assignee: Irion & Vosseler GmbH & Co. & Zahlerfabrik
    Inventors: Herbert Bauser, Edmund Kurz, Bernd Schindler, Klaus Zerweck, Thomas Bolch, Andreas Haller, Theo Mager
  • Patent number: 4205259
    Abstract: To protect the horizontal deflection circuit against reverse polarity high-voltage pulses derived from an inductance, which is provided to rapidly drain stored charge carriers of an output transistor thereof, a protective circuit is connected between the driver stage and the base of the output transistor which includes a transistor controlled by the driver stage, for example by a reverse polarity signal which renders the parallel connected transistor conductive, thereby short-circuiting the reverse polarity pulse with respect to the driver stage and protecting the driver stage thereagainst.
    Type: Grant
    Filed: March 1, 1979
    Date of Patent: May 27, 1980
    Assignee: Blaupunkt-Werke GmbH
    Inventor: Bernd Schindler