Patents by Inventor Bernd Schindler
Bernd Schindler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240290574Abstract: In the context of imaging with a scanning electron microscope, a sample to be imaged is first positioned in a vacuum chamber of the scanning electron microscope (SEM), such that an imaging field of the SEM arrives at a section of the sample to be imaged. Water is added to the vacuum chamber, such that the water is precipitated as an H2O layer on the sample in the region of the imaging field. The sample in the vacuum chamber is then cooled to a temperature below ?10° C. Then a sample cleaning operation is performed with the aid of at least one electron cleaning scan within a cleaning field within which the imaging field lies. The H2O layer is removed during the cleaning scan. Then the imaging field is imaged with the aid of an electron imaging scan after the at least one cleaning scan has ended. The result is an imaging method in which a sample surface of the sample to be imaged in the imaging of an imaging field is reliably clean.Type: ApplicationFiled: May 7, 2024Publication date: August 29, 2024Inventors: Daniel Fischer, Bernd Schindler, Andreas Schmaunz
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Patent number: 11170970Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.Type: GrantFiled: August 21, 2018Date of Patent: November 9, 2021Assignee: Carl Zeiss SMT GmbHInventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
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Patent number: 10274441Abstract: Generating an image of an object and/or a representation of data about the object uses a particle beam apparatus. The particle beam apparatus comprises at least one control unit for setting a guide unit by selecting a value of a control parameter of the control unit. A functional relationship is determined between a first control parameter value and a second control parameter value depending on the predeterminable range of a landing energy of the particles. A desired value of the landing energy is set. The value of the control parameter corresponding to the desired value of the landing energy is selected on the basis of the determined functional relationship and the guide unit is controlled using the value of the control parameter corresponding to the desired value of the landing energy.Type: GrantFiled: May 22, 2017Date of Patent: April 30, 2019Assignee: CARL ZEISS MICROSCOPY GMBHInventors: Christian Hendrich, Bernd Schindler
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Publication number: 20190035601Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.Type: ApplicationFiled: August 21, 2018Publication date: January 31, 2019Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
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Patent number: 10068747Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.Type: GrantFiled: August 31, 2016Date of Patent: September 4, 2018Assignee: Carl Zeiss SMT GmbHInventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
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Publication number: 20170336335Abstract: Generating an image of an object and/or a representation of data about the object uses a particle beam apparatus. The particle beam apparatus comprises at least one control unit for setting a guide unit by selecting a value of a control parameter of the control unit. A functional relationship is determined between a first control parameter value and a second control parameter value depending on the predeterminable range of a landing energy of the particles. A desired value of the landing energy is set. The value of the control parameter corresponding to the desired value of the landing energy is selected on the basis of the determined functional relationship and the guide unit is controlled using the value of the control parameter corresponding to the desired value of the landing energy.Type: ApplicationFiled: May 22, 2017Publication date: November 23, 2017Inventors: Christian Hendrich, Bernd Schindler
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Publication number: 20170062180Abstract: A method for examining a specimen surface with a probe of a scanning probe microscope, the specimen surface having an electrical potential distribution. The method includes (a) determining the electrical potential distribution of at least one first partial region of the specimen surface; and (b) modifying the electrical potential distribution in the at least one first partial region of the specimen surface and/or modifying an electrical potential of the probe of the scanning probe microscope before scanning at least one second partial region of the specimen surface.Type: ApplicationFiled: August 31, 2016Publication date: March 2, 2017Inventors: Michael Budach, Michael Schnell, Bernd Schindler, Markus Boese
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Publication number: 20130256558Abstract: An apparatus for contaminants being deposited thereon in a particle beam device, and also the particle beam device including the apparatus, are provided. This apparatus may be an anticontaminator. The apparatus according to the system described herein may include at least one cooling unit. The cooling unit may provide at least one cooled surface on which contaminants in a particle beam device are deposited. The apparatus according to the system described herein may further include at least one aperture unit. The aperture unit may be arranged at a motion device for moving the aperture unit relative to the cooling unit. Furthermore, the aperture unit may have at least one aperture opening. The cooling unit may be connected to the aperture unit by at least one first flexible thermal conductor.Type: ApplicationFiled: March 29, 2012Publication date: October 3, 2013Inventors: Christian DIETL, Gerald SCHMID, Bernd SCHINDLER, Gerd BENNER, Thilo MANDLER, Marco MATIJEVIC
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Patent number: 7868050Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.Type: GrantFiled: August 10, 2006Date of Patent: January 11, 2011Inventors: Bernd Schindler, Richard McDonogh
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Patent number: 7160927Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.Type: GrantFiled: September 17, 2003Date of Patent: January 9, 2007Inventors: Bernd Schindler, Richard McDonogh
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Publication number: 20060276602Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.Type: ApplicationFiled: August 10, 2006Publication date: December 7, 2006Inventors: Bernd Schindler, Richard McDonogh
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Patent number: 6815678Abstract: The invention relates to a raster electron microscope having a specimen chamber and a detector for electrons mounted in the specimen chamber. The raster electron microscope also includes a specimen table having a specimen holder and the specimen table is mounted in the specimen chamber. A diaphragm system is provided on the specimen table and has a diaphragm between the specimen holder and the detector. The diaphragm system is adjustable relative to the specimen holder. The invention can be configured especially as an ancillary module which is accommodated on the specimen table of a conventional raster electron microscope. The system of raster electron microscope and ancillary unit serves for generating special contrastings, especially a dark-field contrast in transmission.Type: GrantFiled: March 18, 2003Date of Patent: November 9, 2004Assignee: LEO Elektronemikroskopie GmbHInventors: Ute Golla-Schindler, Bernd Schindler
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Publication number: 20040054125Abstract: Porous matrices and membrane matrices comprising sulfonated aryl sulfonate polymers are prepared from a sulfonated aryl sulfonate polymer solution which is made by dissolving an aryl sulfonate polymer, and optionally a polymer other than aryl sulfonate, in a sulfonating acid solvent such as sulfuric acid. The solutions are then cast as wet films from which the matrices are coagulated. By controlling composition and process parameters, hydrophilic matrices of varying morphology are produced.Type: ApplicationFiled: September 17, 2003Publication date: March 18, 2004Inventors: Bernd Schindler, Richard McDonogh
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Publication number: 20030230713Abstract: The invention relates to a raster electron microscope having a specimen chamber and a detector for electrons mounted in the specimen chamber. The raster electron microscope also includes a specimen table having a specimen holder and the specimen table is mounted in the specimen chamber. A diaphragm system is provided on the specimen table and has a diaphragm between the specimen holder and the detector. The diaphragm system is adjustable relative to the specimen holder. The invention can be configured especially as an ancillary module which is accommodated on the specimen table of a conventional raster electron microscope. The system of raster electron microscope and ancillary unit serves for generating special contrastings, especially a dark-field contrast in transmission.Type: ApplicationFiled: March 18, 2003Publication date: December 18, 2003Inventors: Ute Golla-Schindler, Bernd Schindler
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Patent number: 4840636Abstract: A stream of gas is forced through the pores of an object and either the gas itself or a component thereof is electrically activated through partial brush discharge such that reaction products will modify the surface of the pore walls as the gas flows through. The method avoids vacuum deposition methods as well as wet-coating methods and is applicable for either hydrophobizing or hydrophilizing objects and for improving, for example, biochemical activities or compatability of the object with a liquid to be filtered later.Type: GrantFiled: October 9, 1984Date of Patent: June 20, 1989Assignee: Fraunhofer Geselschaft E.V.Inventors: Herbert Bauser, Bernd Schindler, Horst Chmiel
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Patent number: 4495232Abstract: A stamping foil for forming printed circuit patterns on insulating or poorly conductive substrates comprising an electrically conductive layer made of a highly conductive metal, such as copper, which is endowed with a sufficiently low shear strength, even in thicknesses of 10 microns or more, to permit easy and sharp separation of the activated (imprinted) and non-activated portions of the foil. Such a low shear strength may be achieved with fibrous or fibrous-granular crystallite structures, wherein the fibers are oriented approximately at right angles to the surfaces of the foil, and, in addition, by doping agents containing carbon, nitrogen and sulfur. The foil may comprise a bonding layer for bonding the conductive layer to a substrate, or such a bonding layer may be applied to the surface of the conductive layer before the stamping operation. The conductive layer may be either self-supporting, or it may adhere to a carrier tape through an intermediary separating layer.Type: GrantFiled: March 29, 1982Date of Patent: January 22, 1985Assignee: Irion & Vosseler GmbH & Co. & ZahlerfabrikInventors: Herbert Bauser, Edmund Kurz, Bernd Schindler, Klaus Zerweck, Thomas Bolch, Andreas Haller, Theo Mager
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Patent number: 4205259Abstract: To protect the horizontal deflection circuit against reverse polarity high-voltage pulses derived from an inductance, which is provided to rapidly drain stored charge carriers of an output transistor thereof, a protective circuit is connected between the driver stage and the base of the output transistor which includes a transistor controlled by the driver stage, for example by a reverse polarity signal which renders the parallel connected transistor conductive, thereby short-circuiting the reverse polarity pulse with respect to the driver stage and protecting the driver stage thereagainst.Type: GrantFiled: March 1, 1979Date of Patent: May 27, 1980Assignee: Blaupunkt-Werke GmbHInventor: Bernd Schindler