Abstract: A package is disclosed. In one example, the package includes a first main face for mounting a heat sink and an opposing second main face for being mounted on a mounting base. The package comprises a carrier, an electronic component mounted at the carrier, and an encapsulant encapsulating at least part of the electronic component and at least part of the carrier. Electrically insulating material covers electrically conductive material of the carrier at said first main face. The encapsulant comprises at least one step at the first main face.

Abstract: A method includes providing a first lead frame that includes a first die pad and a first row of leads, providing a connection lug, mounting a first semiconductor die on the first die pad, the first semiconductor die including first and second voltage blocking terminals, electrically connecting the connection lug to one of the first and second voltage blocking terminals, electrically connecting a first one of the leads from the first row to an opposite one of the first and second voltage blocking terminals, and forming an encapsulant body of electrically insulating material that encapsulates first die pad and the first semiconductor die. After forming the encapsulant body, the first row of leads each protrude out of a first outer face of the encapsulant body and the connection lug protrudes out of a second outer face of the encapsulant body.

Abstract: A package is disclosed. In one example, the package includes a first main face for mounting a heat sink and an opposing second main face for being mounted on a mounting base. The package comprises a carrier, an electronic component mounted at the carrier, and an encapsulant encapsulating at least part of the electronic component and at least part of the carrier. Electrically insulating material covers electrically conductive material of the carrier at said first main face. The encapsulant comprises at least one step at the first main face.

Abstract: A semiconductor device module includes a package carrier having an opening, wherein in the opening there is disposed a semiconductor package including a semiconductor die, an encapsulant, and first vertical contacts, wherein the encapsulant at least partially covers the semiconductor die, and the first vertical contacts are connected to the semiconductor die and extend at least partially through the encapsulant, and a first outer metallic contact layer electrically connected to the first vertical contacts.

Abstract: A method for fabricating a semiconductor device includes: providing a die carrier; disposing a semiconductor die on a main face of the die carrier, the semiconductor die having one or more contact pads; applying an encapsulant at least partially to the semiconductor die and at least a portion of the main face of the die carrier; applying an insulation layer to the encapsulant; and fabricating electrical interconnects by forming openings into the encapsulant and the insulation layer and filling a conductive material into the openings. Additional methods for fabricating a semiconductor device are described.

Abstract: A semiconductor device includes a die carrier, a semiconductor die disposed on a main face of the die carrier, the semiconductor die including one or more contact pads, an encapsulant covering at least partially the semiconductor die and at least a portion of the main face of the die carrier, an insulation layer covering the encapsulant, and one or more electrical interconnects, each being connected with one of the one or more contact pads of the semiconductor die and extending through the encapsulant.

Abstract: A semiconductor package includes: a semiconductor transistor die having an emitter/source contact pad, a drain/collector contact pad, and a gate contact pad; at least two electrical connectors disposed in a symmetrical manner on opposing lateral sides of the semiconductor die and connected with at least one of the contact pads; and an encapsulant embedding the semiconductor transistor die. The two or more electrical connectors extend through the encapsulant and form protruding sections above an upper surface of the encapsulant.

Abstract: A power semiconductor package comprises a leadframe comprising a first die pad, a second die pad and a plurality of external contacts. The first and second die pads are separated by a first gap. A power semiconductor die is arranged on and electrically coupled to a first side of the first die pad. A diode is arranged on and electrically coupled to a first side of the second die pad. A molded body encapsulates the power semiconductor die and the diode, the molded body having a first side, an opposite second side and lateral sides connecting the first and second sides. A second side of the first die pad is exposed from the second side of the molded body. A second side of the second die pad is completely covered by an electrically insulating material.

Abstract: A package for mounting on a mounting base is disclosed. In one example, the package comprises a carrier, an electronic component mounted at the carrier, leads electrically coupled with the electronic component and to be electrically coupled with the mounting base, and a linear spacer for defining a spacing with respect to the carrier.

Abstract: A package is disclosed. In one example, the package includes a first main face for mounting a heat sink and an opposing second main face for being mounted on a mounting base. The package comprises a carrier, an electronic component mounted at the carrier, and an encapsulant encapsulating at least part of the electronic component and at least part of the carrier. Electrically insulating material covers electrically conductive material of the carrier at said first main face. The encapsulant comprises at least one step at the first main face.

Abstract: A package is disclosed. In one example, the package includes a first main face for mounting a heat sink and an opposing second main face for being mounted on a mounting base. The package comprises a carrier, an electronic component mounted at the carrier, and an encapsulant encapsulating at least part of the electronic component and at least part of the carrier. Electrically insulating material covers electrically conductive material of the carrier at said first main face. The encapsulant comprises at least one step at the first main face.

Abstract: A semiconductor package comprises a semiconductor transistor circuit comprising a semiconductor transistor die comprising die terminals, including a collector/drain, a source/emitter, a sense source/sense emitter, a gate, and a load path, a driver line connected with the gate, and a gate control loop in which the a sense source/sense emitter is connected with the driver line, a plurality of external contacts comprising at least one first external contact connected with the drain/collector, at least one second external contact connected with the source/emitter, a third external contact connected with the a sense source/sense emitter, and a fourth external contact connected with the gate, wherein the plurality of external contacts are arranged or configured to reduce or utilize the magnetic coupling induced by a load current flowing through the load path.

Abstract: An electronic device module includes: a core layer having an opening; an electronic device disposed in the opening, one or both of the core layer and the electronic device being at least partially covered by an adhesion promoter layer; and an encapsulant layer at least partially embedding the core layer and the electronic device.

Abstract: A semiconductor package is disclosed. In one example, the semiconductor package comprises a package body and a second die pad at least partially encapsulated in the package body. A first semiconductor die is at least partially encapsulated in the package body and arranged on the first die pad. A further device at least partially encapsulated in the package body and arranged on the second die pad. At least one first lead is connected with the first contact pad of the first semiconductor die. At least one second lead is connected with the second contact pad of the further device. An electrical conductor is connected between the at least one first lead and the at least one second lead, the electrical conductor being completely encapsulated in the package body.

Abstract: A method for fabricating a semiconductor device module includes: providing a first encapsulant layer and a core layer disposed on the first encapsulant layer, the core layer having an opening; disposing a semiconductor device in the opening, the semiconductor device having a die carrier and a semiconductor die disposed on the die carrier; dispensing an encapsulant onto the semiconductor device; applying a second polymer layer onto the encapsulant so that the encapsulant is pressed into the opening; and laminating together the first and second encapsulant layers and the encapsulant.

Abstract: A semiconductor package is disclosed. In one example, the semiconductor package includes a package body. A first diepad is at least partially uncovered by the package body at the first main surface. A second diepad is at least partially uncovered by the package body at the first main surface. A first semiconductor chip is arranged on the first diepad. A second semiconductor chip is arranged on the second diepad. The semiconductor package further includes at least one lead protruding out of the package body at the side surface. A first groove is formed in the first main surface, wherein the first groove is arranged between the first diepad and the second diepad, and a second groove is formed in the first main surface, wherein the second groove is arranged between the at least one lead and at least one of the first diepad and the second diepad.

Abstract: A semiconductor package includes: a die carrier having a first main face and a second main face opposite to the first main face; a semiconductor die disposed on the die carrier, the semiconductor die including a first pad and a second pad; a first electrical connector disposed on the first pad; an encapsulant at least partially covering the semiconductor die, the die carrier, and the first electrical connector; and an insulation layer disposed on the second main face of the die carrier.

Abstract: A semiconductor package includes a first die pad, a first semiconductor die mounted on the first die pad, an encapsulant body of electrically insulating material that encapsulates first die pad and the first semiconductor die, a plurality of package leads that each protrude out of a first outer face of the encapsulant body, a connection lug that protrudes out of a second outer face of the encapsulant body, the second outer face being opposite from the first outer face. The first semiconductor die includes first and second voltage blocking terminals. The connection lug is electrically connected to one of the first and second voltage blocking terminals of the first semiconductor die. A first one of the package leads is electrically connected to an opposite one of the first and second voltage blocking terminals of the first semiconductor die that the first connection lug is electrically connected to.

Abstract: A stacked module arrangement includes: a first molded electronic module; a second molded electronic module; and an interface by which the first molded electronic module and the second molded electronic module are physically and electrically connected to one another in a stacked configuration. The first molded electronic module is a power electronic module having a maximum breakdown voltage of at least 40 V and a maximum DC current of at least 10 A.

Abstract: A semiconductor assembly includes a laminate substrate that includes a plurality of laminate layers of electrically insulating material stacked on top of one another, a semiconductor package that includes a package body of electrically insulating encapsulant material and a plurality of electrical contacts that are exposed from the package body, wherein the semiconductor package is embedded within the laminate layers of the laminate substrate, wherein the semiconductor package comprises a delamination mitigation feature, wherein the delamination mitigation feature comprises one or both of a macrostructure that engages with the laminate layers, and a roughened surface of microstructures that enhances adhesion between the semiconductor package and the laminate layers.