Patents by Inventor Bernd Widzgowski
Bernd Widzgowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20130043376Abstract: A detector device is configured to receive light and generate electrical signals. The detector device includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component is at least one of: positioned so as to have a light path extend through the cooling component, where the light path is defined by light that is received for detection; designed so as to include a thermally conductive, electrically insulating intermediate element; and disposed in direct contact a light sensor of the detector and/or a substrate bearing the light sensor.Type: ApplicationFiled: December 14, 2011Publication date: February 21, 2013Applicant: LEICA MICROSYSTEMS CMS GMBHInventor: Bernd Widzgowski
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Publication number: 20130043377Abstract: A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor.Type: ApplicationFiled: August 15, 2012Publication date: February 21, 2013Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Frank Schreiber, Bernd Widzgowski, Holger Birk
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Publication number: 20130043378Abstract: A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing.Type: ApplicationFiled: August 15, 2012Publication date: February 21, 2013Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Frank Schreiber, Bernd Widzgowski, Holger Birk
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Publication number: 20130044370Abstract: The invention relates to a device for scanning an object comprising a focusing lens system (30) which focuses an illuminating light beam (24) onto a region of the object to be analyzed. An actuator assembly is coupled to the focusing lens system (30) and moves the focusing lens system (30) in accordance with a predefined scanning pattern transversely to the cecenternter axis of the illumination light beam (24) in a reference position of the illumination light beam (24). A front glass (38) is disposed downstream of the focusing lens system (30) viewed in the direction of the illuminating light beam (24). An internal immersion medium (40) is disposed between the focusing lens system (30) and the front glass (38). An external immersion medium (48) can be introduced between the front glass (38) and the object.Type: ApplicationFiled: February 11, 2011Publication date: February 21, 2013Applicant: Leica Microsystems CMS GmbHInventors: Volker Seyfried, Bernd Widzgowski, Holger Birk
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Publication number: 20130032699Abstract: A device for counting photons includes a detector unit that is configured to generate an detected signal. A switching unit is configured to be impinged upon by the detected signal and to trigger a switching state for each detection pulse so as to generate a state signal. A sampling unit is configured to sample the state signal at a predetermined sampling frequency. A serial-parallel converter unit is configured to parallelize the serially generated sampled data by grouping successive sampled data into a sampled data packet. An evaluation unit is configured to evaluate the binary values of sampled data packets so as to identify a partial counter result indicating the number of switching state changes occurring in the switching unit, and to add partial counter results identified in individual clock cycles.Type: ApplicationFiled: July 31, 2012Publication date: February 7, 2013Applicant: Leica Microsystems CMS GmbHInventor: Bernd Widzgowski
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Publication number: 20130010340Abstract: The invention relates to a device for scanning an object comprising a carrier body (10) and a first electromagnetic drive (2). The carrier body (10) is movably mounted in a plane and holds an optical element (12) that focuses an illuminating light beam (19) on a first object plane of the object that is parallel to the plane. The first electromagnetic drive (2) moves the carrier body (10) with the optical element (12) and a focus region (23) of the illuminating light beam (19) within the first object plane.Type: ApplicationFiled: January 3, 2011Publication date: January 10, 2013Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Holger Birk, Bernd Widzgowski
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Publication number: 20130003172Abstract: A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source (42), which emits an illuminating light beam (32). A focusing lens system (34) focuses the illuminating light beam (32) on a region to be examined of a sample (36). An actuator arrangement moves the focusing lens system (34) according to a prescribed scanning pattern transversely in relation to a center axis of the illuminating light beam (32) and/or in relation to a housing of a structural unit (20) that encloses the focusing lens system (34).Type: ApplicationFiled: February 11, 2011Publication date: January 3, 2013Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Bernd Widzgowski, Holger Birk, Volker Seyfried
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Publication number: 20120236398Abstract: The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found.Type: ApplicationFiled: June 1, 2012Publication date: September 20, 2012Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Hilmar GUGEL, Arnold GISKE, Marcus DYBA, Roland SEIFERT, Bernd WIDZGOWSKI
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Patent number: 8253937Abstract: An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.Type: GrantFiled: November 25, 2009Date of Patent: August 28, 2012Assignee: Leica Microsystems CMS GmbHInventors: Vishnu Vardhan Krishnamachari, William C. Hay, Volker Seyfried, Bernd Widzgowski
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Publication number: 20120193513Abstract: The invention relates to a laser system (20) for a microscope, comprising a laser module (22), a beam correction device (26), an optical fiber (31), a measuring element (34), and an external controller (37). The laser module (22) generates a light beam (24). The light beam (24) penetrates the beam correction device (26), which corrects a deviation of an actual value of at least one parameter of the light beam (24) from a target value of the parameter. The corrected light beam (24) is coupled into the optical fiber (31). The measuring element (34) is connected downstream of the optical fiber (31) and captures an actual value (36) of the intensity of at least one partial beam (32) of the corrected light beam (24). The external controller (37), regulates the actual value (36) of the intensity to a prescribed target value for the intensity.Type: ApplicationFiled: October 8, 2010Publication date: August 2, 2012Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Bernd Widzgowski, Volker Seyfried, Holger Birk
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Publication number: 20120175505Abstract: A method and a device for scanning-microscopy imaging of a specimen (28) are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam (14) in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.Type: ApplicationFiled: January 11, 2012Publication date: July 12, 2012Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Holger Birk, Bernd Widzgowski, Holger Nissle
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Publication number: 20110304900Abstract: An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components.Type: ApplicationFiled: June 1, 2011Publication date: December 15, 2011Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Bernd Widzgowski, Holger Birk, Volker Seyfried
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METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT
Publication number: 20110149290Abstract: A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.Type: ApplicationFiled: November 25, 2010Publication date: June 23, 2011Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Ludger Schulte, Bernd Widzgowski -
Publication number: 20100134793Abstract: An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.Type: ApplicationFiled: November 25, 2009Publication date: June 3, 2010Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Vishnu Vardhan Krishnamachari, William C. Hay, Volker Seyfried, Bernd Widzgowski
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Patent number: 7676071Abstract: A method for illuminating a specimen or a region of the specimen (region of interest, ROI), the information indicating whether and in what manner a specific point on the specimen is to be illuminated, being stored in a data memory under a specific address. A change in the position, orientation, and/or shape of the specimen is captured, and a transformation of the coordinates of the image points to be illuminated is derived therefrom; memory addresses are uniquely assigned to the transformed coordinates; and, on the basis of the memory addresses, the data memory is accessed, and its contents is read out in order to control the light source.Type: GrantFiled: March 3, 2006Date of Patent: March 9, 2010Assignee: Leica Microsystems CMS GmbHInventor: Bernd Widzgowski
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Patent number: 7554722Abstract: A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for the scanner.Type: GrantFiled: October 6, 2006Date of Patent: June 30, 2009Assignee: Leica Microsystems CMS GmbHInventor: Bernd Widzgowski
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Patent number: 7495236Abstract: An apparatus and a method for detection with a scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (Px,y) and calculates an average therefrom, is placed after the detector unit (19).Type: GrantFiled: September 19, 2006Date of Patent: February 24, 2009Assignee: Leica Microsystems CMS GmbHInventors: Bernd Widzgowski, Holger Birk
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Patent number: 7492511Abstract: The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.Type: GrantFiled: July 20, 2005Date of Patent: February 17, 2009Assignee: Leica Microsystems CMS GmbHInventors: Werner Knebel, Bernd Widzgowski
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Patent number: 7345800Abstract: An optical arrangement for deflecting a light beam includes first and second deflection devices, and a coupling mirror. The first deflection device is rotatable about a first axis using a first rotary drive, and includes two mirrors disposed non-rotatably with respect to each other in an angular position so as to rotate jointly about the first axis. The second deflection device is rotatable about a second axis using a second rotary drive, and includes a third mirror. The coupling mirror deflects the light beam onto the first or second mirror at an angle greater than 45° relative to the surface of the mirror. The first and second axes are perpendicular to each other. The first and a second mirrors rotate jointly about the first axis so that the light beam rotates about a center of rotation located on the second axis.Type: GrantFiled: February 3, 2006Date of Patent: March 18, 2008Assignee: Leica Microsystems CMS GmbHInventor: Bernd Widzgowski
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Publication number: 20070223076Abstract: The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.Type: ApplicationFiled: July 20, 2005Publication date: September 27, 2007Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Werner Knebel, Bernd Widzgowski