Abstract: The present invention relates to a vacuum cleaner device (1) for operation on a floor area (F), comprising: a suction duct (7) and an actuator (9) arranged and configured to generate an underpressure in the suction duct (7) so that air is sucked into the suction duct (7), a temperature sensor (10) configured to sample an air temperature in the vicinity of the device (1), wherein said temperature sensor (10) is arranged in the suction duct (7) or adjacent an opening (6d) of the suction duct (7), and an analyzing unit (3) configured to detect a wet spot (W) on said floor area (F) using said sampled air temperature.

Abstract: The present invention relates to a vacuum cleaner device (1) for operation on a floor area (F), comprising: a suction duct (7) and an actuator (9) arranged and configured to generate an underpressure in the suction duct (7) so that air is sucked into the suction duct (7), a temperature sensor (10) configured to sample an air temperature in the vicinity of the device (1), wherein said temperature sensor (10) is arranged in the suction duct (7) or adjacent an opening (6d) of the suction duct (7), and an analyzing unit (3) configured to detect a wet spot (W) on said floor area (F) using said sampled air temperature.

Abstract: A method comprising forming on a common support (6) one or more series of multi-layer electronic devices (covering the areas 2a, 2b respectively), and then separating the electronic devices; wherein the devices comprise one or more organic layers (9), and the method comprises depositing one or more of the organic layers (9) as a respective continuous layer extending at least from one end of the one or more series of devices to an opposite end of the one or more series of devices.

Abstract: A method comprising forming on a common support (6) one or more series of multi-layer electronic devices (covering the areas 2a, 2b respectively), and then separating the electronic devices; wherein the devices comprise one or more organic layers (9), and the method comprises depositing one or more of the organic layers (9) as a respective continuous layer extending at least from one end of the one or more series of devices to an opposite end of the one or more series of devices.

Abstract: A device for nondestructive and noncontact detection of faults in a test piece, with a stationary measurement device (16) for taking an eddy current or a magnetic stray flux measurements on a test piece (10) continuously advanced relative to the measurement device; and a device (12) for positioning the test piece with respect to the measurement device in a plane perpendicular to the direction of movement of the test piece. The device also has a monitoring unit (20) with at least three distance sensors (22) arranged distributed around the test piece in the peripheral direction for contactless detection of the distance between the surface of the test piece facing the respective sensor and the respective sensor, as well as a unit for evaluating the signals from the sensors.

Abstract: Interconnect structures and methods are disclosed. In one embodiment, an interconnect structure includes a via extendable through a workpiece from a first side of the workpiece to a second side of the workpiece. The via is partially filled with a conductive material and has sidewalls. The interconnect structure includes a contact coupled to the conductive material in the via proximate the first side of the workpiece. The conductive material in the via comprises a recessed region comprising a landing zone proximate the second side of the workpiece.

Abstract: In a method of making an electronic component, an electrically conductive redistribution line is formed on a surface of a semiconductor chip. The redistribution line includes a solder pad. A covering material is formed over the solder pad and an uncovered portion of the redistribution line is passivated. The covering material prevents passivation of the solder pad. Solder is then formed over the solder pad such that the uncovered portion of the redistribution line has solder resist properties due to the passivating.

Abstract: Interconnect structures and methods are disclosed. In one embodiment, an interconnect structure includes a via extendable through a workpiece from a first side of the workpiece to a second side of the workpiece. The via is partially filled with a conductive material and has sidewalls. The interconnect structure includes a contact coupled to the conductive material in the via proximate the first side of the workpiece. The conductive material in the via comprises a recessed region comprising a landing zone proximate the second side of the workpiece.

Abstract: A device for nondestructive and noncontact detection of faults in a test piece, with a stationary measurement device (16) for taking an eddy current or a magnetic stray flux measurements on a test piece (10) continuously advanced relative to the measurement device; and a device (12) for positioning the test piece with respect to the measurement device in a plane perpendicular to the direction of movement of the test piece. The device also has a monitoring unit (20) with at least three distance sensors (22) arranged distributed around the test piece in the peripheral direction for contactless detection of the distance between the surface of the test piece facing the respective sensor and the respective sensor, as well as a unit for evaluating the signals from the sensors.

Abstract: A test device for testing of tubular specimens has a plurality of individual, radially movable, finger-shaped test probes which are placed from all sides on the outside of the specimen to be tested. In this way, the test specimen is surrounded by test probes and can be pushed under them. Each test probe has a first test coil with a surface which faces essentially parallel to the lengthwise axis of the specimen and a second test coil which is oriented essentially perpendicular to the lengthwise axis of the specimen. The test probes can be elastically deflectable, pivotably movable, or movable by a screw mechanism.

Abstract: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.

Abstract: A test device for testing of tubular specimens has a plurality of individual, radially movable, finger-shaped test probes which are placed from all sides on the outside of the specimen to be tested. In this way, the test specimen is surrounded by test probes and can be pushed under them. Each test probe has a first test coil with a surface which faces essentially parallel to the lengthwise axis of the specimen and a second test coil which is oriented essentially perpendicular to the lengthwise axis of the specimen. The test probes can be elastically deflectable, pivotably movable, or movable by a screw mechanism.

Abstract: Pigmented polymer compositions and processes for preparing melt-processible polymer compositions contain a melt-processible polymer, surface treated organic pigment, typically titanium dioxide, and a polymer processing aid are described. The pigment is surface treated by contact with a silicon-containing compound, such as octyltriethoxysilane followed by contact with an organic compound such as isostearic acid or ethoxylated silicone. The pigmented polymer composition containing a polymer processing aid facilitates production of shaped articles with low melt fracture.

Abstract: In a method of making an electronic component, an electrically conductive redistribution line is formed on a surface of a semiconductor chip. The redistribution line includes a solder pad. A covering material is formed over the solder pad and an uncovered portion of the redistribution line is passivated. The covering material prevents passivation of the solder pad. Solder is then formed over the solder pad such that the uncovered portion of the redistribution line has solder resist properties due to the passivating.

Abstract: A stray flux measurement device for detection of defects near the surface and remote from the surface on ferromagnetic specimens (10) is characterized by at least one coil (20) or an equivalently acting core/coil combination that faces the specimen (24, 22) and at least one coil (30, 40) or an equivalently acting core/coil combination (34, 32; 44, 42) that faces at an angle relative to the surface of the specimen.

Abstract: A fuel fired appliance exhaust gas parameter sensor for continually detecting gas parameter emissions, such as CO, NOx and O2, may be located above the appliance near the appliance exhaust outlet. The sensor may be located near or under a draft hood located near the exhaust outlet. The sensor remains relatively cool by draft air moving from outside the draft hood and into a chimney, the draft being hastened by the heated, rising chimney gases. A sensor bracket may be attached to the appliance and the sensor to appropriately position the sensor under the draft hood. Alternatively, the sensor may be located on a tube that continually samples combustion exhaust. The tube may be located outside of the draft hood perimeter to maintain a low sensor temperature, while multiple tube coils around the exhaust outlet may be used to further cool the sampled gas.

Abstract: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.

Abstract: A device for testing a test specimen for surface faults is equipped for delivering a magnetic flux into the specimen and has induction probes measurement sensors. At least two yoke legs have opposed gap-forming ends with oppositely poled exciter coils between which the test specimen can be guided. Outside ends of the yoke legs opposite the gap-forming ends are connected to one another by a magnetic flux conductor so that the magnetic flux runs perpendicular to the lengthwise direction through the test specimen. To adapt to test specimens of different cross section, the yoke legs can be moved and fixed. Testing of test specimens by means of high-energy magnetic alternating fields improved because the high heat losses produced in this process are adequately dissipated. The device is especially well suited to determine the quality of bars, pipes and the like in a hot rolling mill with high-energy alternating magnetic fields.