Abstract: A probe arrangement for a testing system includes a base carrier that defines a longitudinal direction, which can be oriented parallel to a testing direction, and a transverse direction, which can be oriented perpendicularly to the testing direction. The base carrier carries a plurality of probe holders which are arranged next to one another in a row in the transverse direction. Each probe holder has a first probe region, which is equipped with at least one first probe, and a second probe region, which is equipped with at least one second probe. Each probe region defines an effective testing width such that, during relative movement of the test subject with respect to the probe arrangement along the testing direction through the probe region, a testing track having the effective testing width can be tested in a gap-free manner.