Abstract: Various embodiments may relate to a method for determining life expectancy information of an LED module with a plurality of LEDs. The method includes detecting of forward biases of the LED module at instants of time which lie less than 100 ms apart from each other, comparing a currently detected forward bias with one or more earlier detected forward biases, in order to detect a voltage jump which reaches a minimum initial inverse voltage within a predetermined jump duration, wherein the minimum initial inverse voltage is at least 60 mV and the predetermined jump duration is less than 100 ms long, and determining life expectancy information based on one or more detected voltage jumps.

Abstract: Various embodiments may relate to a method for determining life expectancy information of an LED module with a plurality of LEDs. The method includes detecting of forward biases of the LED module at instants of time which lie less than 100 ms apart from each other, comparing a currently detected forward bias with one or more earlier detected forward biases, in order to detect a voltage jump which reaches a minimum initial inverse voltage within a predetermined jump duration, wherein the minimum initial inverse voltage is at least 60 mV and the predetermined jump duration is less than 100 ms long, and determining life expectancy information based on one or more detected voltage jumps.