Patents by Inventor Bert Hecht

Bert Hecht has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220190205
    Abstract: Provided is a device for emitting electromagnetic radiation. The device includes a first electrode, a second electrode, and an exciton recombination layer extending from the first electrode to the second electrode. The device is configured to relocate a recombination zone in the exciton recombination layer by changing an electric field between the first electrode and the second electrode, or to emit electromagnetic radiation through a transparent substrate.
    Type: Application
    Filed: December 7, 2021
    Publication date: June 16, 2022
    Inventors: Bert Hecht, Jens Pflaum, Rene Kullock, Stefan Zeissner, Monika Emmerling, Philipp Grimm, Enno Schatz
  • Publication number: 20220066315
    Abstract: Provided is a method and an apparatus of manufacturing nano-structures by cutting out portions of a material layer and removing the cut-out portions.
    Type: Application
    Filed: January 24, 2020
    Publication date: March 3, 2022
    Inventors: Enno Krauss, Bert Hecht, Thien Anh Le, Henriette Maass
  • Patent number: 7657133
    Abstract: An apparatus for single analyte molecule detection includes: a light source (20) for generating excitation light; a dichroic mirror (22) disposed on a first path of excitation light generated by the light source, wherein the mirror directs excitation light into a fiber aligner (30); an optical transducer coupled to the light source by the fiber aligner, the optical transducer comprising an optical waveguide (40) made of dielectric material having a first dielectrical index; a photon detector (70) disposed to receive fluorescent back radiation, wherein when a test solution having a second dielectric index lower than the first index is provided and comprises one or more target molecules, excitation light is transmitted by the waveguide and exits a waveguide tip disposed in the test solution so as to excite one or more target molecules; subsequently, the waveguide transmits back radiation along a second path to the photon detector that detects the transmitted back radiation.
    Type: Grant
    Filed: August 18, 2005
    Date of Patent: February 2, 2010
    Assignee: University of Basel
    Inventors: Bert Hecht, Philippe Haas, Andreas Wild, Martin Hegner, Michel Calame
  • Publication number: 20080089635
    Abstract: An apparatus for single analyte molecule detection includes: a light source (20) for generating excitation light; a dichroic mirror (22) disposed on a first path of excitation light generated by the light source, wherein the mirror directs excitation light into a fiber aligner (30); an optical transducer coupled to the light source by the fiber aligner, the optical transducer comprising an optical waveguide (40) made of dielectric material having a first dielectrical index; a photon detector (70) disposed to receive fluorescent back radiation, wherein when a test solution having a second dielectric index lower than the first index is provided and comprises one or more target molecules, excitation light is transmitted by the waveguide and exits a waveguide tip disposed in the test solution so as to excite one or more target molecules; subsequently, the waveguide transmits back radiation along a second path to the photon detector that detects the transmitted back radiation.
    Type: Application
    Filed: August 18, 2005
    Publication date: April 17, 2008
    Applicant: UNIVERSITY OF BASEL
    Inventors: Bert Hecht, Philippe Haas, Andreas Wild, Martin Hegner, Michel Calame
  • Patent number: 5739527
    Abstract: The invention relates to a near-field optical microscope, in particular to a scanning near-field optical microscope (SNOM), comprising means for determining the intensity of light emerging from the near-field at a direction differing from the direction perpendicular to the surface of the sample to be examined, preferably emerging at an angle .theta. larger than the critical angle. The invention allows an accurate control of the distance between the probing tip of the SNOM and the sample by using the measured intensity in a feedback loop.
    Type: Grant
    Filed: April 25, 1996
    Date of Patent: April 14, 1998
    Assignee: International Business Machines Corporation
    Inventors: Bert Hecht, Harald Heinzelmann, Lukas Novotny, Wolfgang Pohl