Patents by Inventor Bertold Deppisch

Bertold Deppisch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Rotation angle measuring with overlap area is between two optical grating axes
    Patent number: 5065014
    Abstract: A method and apparatus for measuring a rotation angle. At least one rotatable optical grating is provided to be pivotal on a rotation axis relative to one or more slits parallel to the rotatable optical grating. The rotatable optical grating is radial to the rotation axis. To measure a rotation angle the rotatable optical grating is pivoted relative to at least one stationary optical grating which is radial to a center opposite to a center of the rotatable optical grating. An overlap area is defined between the two optical gratings and measurement of the relative movement between the rotatable optical grating and the stationary optical grating is detected by at least one photoelectric receiver.
    Type: Grant
    Filed: March 2, 1990
    Date of Patent: November 12, 1991
    Assignee: Gunther Krieg
    Inventors: Gunther Krieg, Werner Helget, Bertold Deppisch