Abstract: An indentation head system for an indentation instrument includes: an indenter tip contacting a sample surface along at least an indentation axis; a reference element supporting the tip; a zero-level sensor generating a signal indicating whether the tip is displaced with respect to the reference element from a neutral relative position; an elastic element between the tip and an actuator with known elongation, the actuator connected to the reference element; and a controller receiving signals from the zero-level sensor to perform servo control of the actuator based on output of the zero-level sensor and the known elongation of the actuator so the zero-level sensor outputs a signal corresponding to a substantially zero displacement of the tip from the neutral relative position, the controller calculating a force applied by the tip to the sample based on an output of the displacement sensor and an elastic coefficient of the elastic element.

Abstract: Sample holder for a material testing device, said sample holder comprising: —a holder body having an end face defining a plane; —a sample plate arranged at said end face of the holder body and arranged to receive a sample; —a clamping arrangement. According to the invention, said clamping arrangement comprises a clamping ring comprising:—a cylindrical portion sized to fit over said holder body; —an annular flange extending inwardly from an extremity of the cylindrical portion; —a plurality of resilient tongues extending inwardly from said annular flange; —a plurality of helical slots distributed around the cylindrical portion and each arranged to interact with a corresponding stud provided on said holder body, each helical slot comprising a plurality of notches provided at the edge of the slot situated away from the flange.

Abstract: Sample holder for a material testing device, said sample holder comprising: —a holder body having an end face defining a plane; —a sample plate arranged at said end face of the holder body and arranged to receive a sample; —a clamping arrangement. According to the invention, said clamping arrangement comprises a clamping ring comprising:—a cylindrical portion sized to fit over said holder body; —an annular flange extending inwardly from an extremity of the cylindrical portion; —a plurality of resilient tongues extending inwardly from said annular flange; —a plurality of helical slots distributed around the cylindrical portion and each arranged to interact with a corresponding stud provided on said holder body, each helical slot comprising a plurality of notches provided at the edge of the slot situated away from the flange.

Abstract: Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

Abstract: Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.

Abstract: Method of evaluation a performance of a surface of a material, the method comprising steps of: measuring a first surface profile of a material sample along a predetermined track by bringing a tip of a stylus into contact with a surface of the sample and traversing said tip across the surface of the sample in a direction tangential to the tip of the stylus while recording said first surface profile, subsequently; applying a normal force to the surface of the sample with the stylus, said normal force being in a direction substantially perpendicular to the surface of the sample, subsequently; moving said tip across the surface of the sample following at least part of said predetermined track while applying said normal force, subsequently; measuring a second surface profile of said sample along at least part of said predetermined track by bringing said tip into contact with the surface of the sample and traversing said tip across the surface of the sample along said track while recording said second surface pr

Abstract: Measuring a topographic profile and/or a topographic image of a surface of a sample includes positioning an indenter out of contact with a sample and in a constant position with respect to a headstock; positioning a topographic tip to detect a surface of the sample and positioning a reference structure at a predetermined distance from said surface; measuring the relative position of the indenter with respect to the reference structure by a relative position sensor; translating said sample perpendicular to said longitudinal axis while maintaining the reference structure at said predetermined distance from the surface of the sample by the feedback control system and the second actuator while measuring the relative position of the indenter with respect to the reference structure by the relative position sensor; and generating a topographic profile and/or a topographic image based on measurements of the relative position.

Abstract: A measuring head for a nano-indentation instrument, said nano-indentation instrument comprising a positioning system arranged to position a sample relative to the measuring head, the measuring head comprising: a measuring subsystem attached to a frame adapted to be connected to the nano-indentation instrument, the measuring subsystem comprising a first actuator and an indenter adapted to indent a surface of said sample under application of a force applied by the first actuator on the indenter, the measuring subsystem further comprising a force sensing system adapted to detect said force applied by the first actuator; a reference subsystem attached to said frame, the reference subsystem comprising a second actuator, a reference structure in operative connection with the second actuator, and a separation detector adapted to determine a predetermined separation of the reference structure and said surface of said sample.

Abstract: Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

Abstract: Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.

Abstract: Measuring a topographic profile and/or a topographic image of a surface of a sample includes positioning an indenter out of contact with a sample and in a constant position with respect to a headstock; positioning a topographic tip to detect a surface of the sample and positioning a reference structure at a predetermined distance from said surface; measuring the relative position of the indenter with respect to the reference structure by a relative position sensor; translating said sample perpendicular to said longitudinal axis while maintaining the reference structure at said predetermined distance from the surface of the sample by the feedback control system and the second actuator while measuring the relative position of the indenter with respect to the reference structure by the relative position sensor; and generating a topographic profile and/or a topographic image based on measurements of the relative position.

Abstract: A measuring head for a nano-indentation instrument, said nano-indentation instrument comprising a positioning system arranged to position a sample relative to the measuring head, the measuring head comprising: a measuring subsystem attached to a frame adapted to be connected to the nano-indentation instrument, the measuring subsystem comprising a first actuator and an indenter adapted to indent a surface of said sample under application of a force applied by the first actuator on the indenter, the measuring subsystem further comprising a force sensing system adapted to detect said force applied by the first actuator; a reference subsystem attached to said frame, the reference subsystem comprising a second actuator, a reference structure in operative connection with the second actuator, and a separation detector adapted to determine a predetermined separation of the reference structure and said surface of said sample.

Abstract: A method for analyzing a scratch from a scratch test includes (a) locating the beginning of the scratch relative to a reference position, (b) making the scratch on a bulk with an indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter relative to the reference position, (c) acquiring and recording images of the scratch relative to the reference position, (d) synchronizing the recorded images, the applied force and the measurement parameter, as a function of the displacement of the indenter, (e) displaying curves of the applied force and of the measurement parameter as a function of the displacement of the indenter, and (f) displaying in a synchronized way an image of the scratch reconstructed from the recorded images.

Abstract: The invention relates to a method for analyzing a scratch from a scratch test, applying a digital image acquisition device, a bulk and an indenter for applying a force on the bulk, the method comprising the following steps: determining the position of the beginning of the scratch relatively to the reference position, making the scratch on the bulk by means of the indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter on the bulk relatively to the reference position, acquiring and recording the images of the whole of the significant portion of the scratch, the position on the scratch corresponding to the recorded images, being determined relatively to the reference position, synchronization of the recorded images, of the applied force and the measurement parameter, as a function of the displacement of the indenter, displaying the curves of the applied force and of the measurement parameter as a function of the displacement of the