Patents by Inventor Bertrand Le Conte Chrestien De Poly
Bertrand Le Conte Chrestien De Poly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11922623Abstract: Detection of pathological abnormalities in tissue samples and/or pluralities of cells is a highly specialized and time-consuming effort, usually performed by a select group of clinicians and technical personnel. Described herein are methods for more automatable, consistent and comprehensive cell sample analysis to deliver a rapid, reliable and detailed classification, e.g., diagnosis, of the status of cells present in a sample, particularly, but not limited to cancer diagnosis.Type: GrantFiled: July 13, 2021Date of Patent: March 5, 2024Assignee: Aquyre Biosciences, Inc.Inventors: Bertrand Le Conte Chrestien De Poly, Emilie Benoit A La Guillaume, Zoya I. Volynskaya
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Publication number: 20220012879Abstract: Detection of pathological abnormalities in tissue samples and/or pluralities of cells is a highly specialized and time-consuming effort, usually performed by a select group of clinicians and technical personnel. Described herein are methods for more automatable, consistent and comprehensive cell sample analysis to deliver a rapid, reliable and detailed classification, e.g., diagnosis, of the status of cells present in a sample, particularly, but not limited to cancer diagnosis.Type: ApplicationFiled: July 13, 2021Publication date: January 13, 2022Inventors: Bertrand LE CONTE CHRESTIEN DE POLY, Emilie BENOIT A LA GUILLAUME, Zoya I. VOLYNSKAYA
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Patent number: 9255785Abstract: A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.Type: GrantFiled: July 8, 2011Date of Patent: February 9, 2016Assignee: LLTECH MANAGEMENTInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
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Patent number: 9185357Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: —a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603), —a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624)Type: GrantFiled: September 19, 2011Date of Patent: November 10, 2015Assignee: LLTECH MANAGEMENTInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
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Patent number: 9025150Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals.Type: GrantFiled: May 17, 2011Date of Patent: May 5, 2015Assignee: LLTech ManagementInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien de Poly
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Publication number: 20130182096Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising:—a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603),—a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624),Type: ApplicationFiled: September 19, 2011Publication date: July 18, 2013Applicant: LLTECH MANAGEMENTInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
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Publication number: 20130107268Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals.Type: ApplicationFiled: May 17, 2011Publication date: May 2, 2013Applicant: LLTECH MANAGEMENTInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly
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Publication number: 20130107275Abstract: According to one aspect, the invention relates to a device (20) for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample (1) comprising an emission source (201) for emitting an incident wave with low temporal coherence, an imaging interferometer (200) of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror (205) and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms of the interferometer, a processing unit (206) for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, means for axially displacing the interfType: ApplicationFiled: July 8, 2011Publication date: May 2, 2013Applicant: LLTECH MANAGEMENTInventors: Albert Claude Boccara, Fabrice Harms, Bertrand Le Conte Chrestien De Poly