Patents by Inventor Bharath Achyutha Rao

Bharath Achyutha Rao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • FEATURE INSPECTION SYSTEM
    Publication number: 20230252648
    Abstract: A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
    Type: Application
    Filed: April 18, 2023
    Publication date: August 10, 2023
    Applicant: Spirit AeroSystems, Inc.
    Inventors: Mark Davis Haynes, Glen Paul Cork, Bharath Achyutha Rao, John Thomas Baumfalk-Lee, Matthew W. McKenna, Bruce E. Gabel, Scott Bishop, Gregorio Balandran
  • Feature inspection system
    Patent number: 11631184
    Abstract: A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
    Type: Grant
    Filed: September 18, 2020
    Date of Patent: April 18, 2023
    Assignee: SPIRIT AEROSYSTEMS, INC.
    Inventors: Mark Davis Haynes, Glen Paul Cork, Bharath Achyutha Rao, John Thomas Baumfalk-Lee, Matthew W. McKenna, Bruce E. Gabel, Scott Bishop, Gregorio Balandran
  • FEATURE INSPECTION SYSTEM
    Publication number: 20220092793
    Abstract: A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
    Type: Application
    Filed: September 18, 2020
    Publication date: March 24, 2022
    Applicant: SPIRIT AEROSYSTEMS, INC.
    Inventors: Mark Davis Haynes, Glen Paul Cork, Bharath Achyutha Rao, John Thomas Baumfalk-Lee, Matthew W. McKenna, Bruce E. Gabel, Scott Bishop, Gregorio Balandran
  • FEATURE INSPECTION SYSTEM
    Publication number: 20220092766
    Abstract: A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
    Type: Application
    Filed: September 3, 2021
    Publication date: March 24, 2022
    Applicant: Spirit AeroSystems, Inc.
    Inventors: Mark Davis Haynes, Glen Paul Cork, Bharath Achyutha Rao, John Thomas Baumfalk-Lee, Matthew W. McKenna, Bruce E. Gabel, Scott Bishop, Gregorio Balandran