Patents by Inventor BHAVADIP SOLANKI

BHAVADIP SOLANKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250140330
    Abstract: A storage device identifies a die with a defective temperature sensor and excludes the die temperature from thermal calculations. The storage device includes a memory device with multiple dies. Each die includes a temperature sensor. A controller on the storage device executes a defective temperature sensor scheme to obtain a temperature for a first die in the memory device. The controller compares the first die temperature against a benchmark. The controller determines that the first die includes a defective temperature sensor if there is a temperature variance in the first die temperature and the benchmark and if the temperature variance is greater than a die temperature variation threshold.
    Type: Application
    Filed: October 25, 2023
    Publication date: May 1, 2025
    Applicant: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: VARUN SHARMA, SOURABH SANKULE, RAGHAVENDRA MYLARAPPA, BHAVADIP SOLANKI
  • Patent number: 10319445
    Abstract: Apparatuses, systems, methods, and computer program products for programming an unprogrammed upper page based on lower page programming are disclosed. An apparatus includes a non-volatile storage device and a controller. A controller includes a data component that is configured to receive a write request for a first page of a set of multi-level storage cells of a non-volatile storage device. A set of multi-level storage cells includes a first page and a second page. A controller includes a page component that is configured to determine that a write request does not comprise data for at least a portion of a second page of a set of multi-level storage cells. A controller includes a write component that is configured to program at least a portion of a second page of a set of multi-level storage cells with data of a first page of a set of multi-level storage cells.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: June 11, 2019
    Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
    Inventors: Bhavadip Solanki, Anantharaj Thalaimalai Vanaraj, Suman Tenugu, Arun Thandapani, Piyush Anil Dhotre, Chittoor Devarajan Sunilkumar, Dharmaraju Marenhally Krishna
  • Publication number: 20190164612
    Abstract: Apparatuses, systems, methods, and computer program products for programming an unprogrammed upper page based on lower page programming are disclosed. An apparatus includes a non-volatile storage device and a controller. A controller includes a data component that is configured to receive a write request for a first page of a set of multi-level storage cells of a non-volatile storage device. A set of multi-level storage cells includes a first page and a second page. A controller includes a page component that is configured to determine that a write request does not comprise data for at least a portion of a second page of a set of multi-level storage cells. A controller includes a write component that is configured to program at least a portion of a second page of a set of multi-level storage cells with data of a first page of a set of multi-level storage cells.
    Type: Application
    Filed: November 30, 2017
    Publication date: May 30, 2019
    Applicant: Western Digital Technologies, Inc.
    Inventors: BHAVADIP SOLANKI, ANANTHARAJ THALAIMALAI VANARAJ, SUMAN TENUGU, ARUN THANDAPANI, PIYUSH ANIL DHOTRE, CHITTOOR DEVARAJAN SUNILKUMAR, DHARMARAJU MARENHALLY KRISHNA
  • Publication number: 20180364304
    Abstract: Apparatuses, systems, methods, and computer program products are disclosed for stimulus generation for component-level verification. A method includes monitoring one or more internal signals for one or more components of a chip during a full-chip verification process. A method includes generating one or more stimuli for triggering one or more internal signals during verification of one or more components of a chip. Stimuli may be generated based in part on feedback from a full-chip verification process. A method includes verifying an operating state of one or more components of a chip in response to generated stimuli that trigger one or more internal signals during verification of the one or more components.
    Type: Application
    Filed: June 14, 2017
    Publication date: December 20, 2018
    Applicant: SanDisk Technologies LLC
    Inventors: NAMAN RASTOGI, BHAVADIP SOLANKI, SURESH HOSUDI SHANKARA NAIK