Abstract: A controlled start-up circuit mechanism in a linear voltage regulator can handle a higher supply voltage at start-up and limits the voltage seen at the devices to be lower than the maximum allowed operation voltage. The circuit may regulate voltage for operating a device coupled to a host when the host supply exceeds that necessary for device operation. The controlled start-up mechanism handles a sudden ramp up or spike of supply voltage relative to the device's operational voltage.

Abstract: A method and device for calibrating an oscillator and a temperature sensor in an electronic device are provided. A same temperature cycle, which includes at least two distinct temperatures, may be used to obtain data to calibrate both the oscillator and the temperature sensor. One of the distinct temperatures may comprise an ambient temperature, and a second distinct temperature may comprise a heated temperature greater than the ambient temperature. The electronic device (or a calibration device separate from the electronic device) may receive the readings from the oscillator and the temperature sensor at the two distinct temperatures in the same temperature cycle, and may determine an oscillator correction factor and a temperature sensor correction factor.

Abstract: Tuning circuitry may include a controller that is configured to determine a phase difference for a pair of signals generated at different points in a master delay line of a master-slave delay locked loop (DLL) circuit. One of signals of the pair may be communicated through a slave delay line of the master-slave DLL circuit before the phase difference is determined. A programming delay value used to set a phase delay of the slave delay line may be adjusted or tuned based on the phase difference.

Abstract: Tuning circuitry may include a controller that is configured to determine a phase difference for a pair of signals generated at different points in a master delay line of a master-slave delay locked loop (DLL) circuit. One of signals of the pair may be communicated through a slave delay line of the master-slave DLL circuit before the phase difference is determined. A programming delay value used to set a phase delay of the slave delay line may be adjusted or tuned based on the phase difference.

Abstract: A method for calibrating an oscillator in an electronic device and an electronic device configured for calibration are provided. Multiple signals are sent to the electronic device from another electronic device, such as from a host device. With knowledge of the time interval between the multiple signals, the electronic device may calibrate the oscillator in the electronic device. For example, the electronic device may be a USB-compliant electronic device. The USB-compliant electronic device may receive Start of Frame (SoF) signals from a host device, which in one USB implementation is received at 1 mSec intervals. The USB-compliant electronic device may count the output of the oscillator between receipt of different SoF signals in order to determine the frequency of the oscillator at different oscillator settings.

Abstract: A method and device for calibrating an oscillator and a temperature sensor in an electronic device are provided. A same temperature cycle, which includes at least two distinct temperatures, may be used to obtain data to calibrate both the oscillator and the temperature sensor. One of the distinct temperatures may comprise an ambient temperature, and a second distinct temperature may comprise a heated temperature greater than the ambient temperature. The electronic device (or a calibration device separate from the electronic device) may receive the readings from the oscillator and the temperature sensor at the two distinct temperatures in the same temperature cycle, and may determine an oscillator correction factor and a temperature sensor correction factor.

Abstract: A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices.

Abstract: A controlled start-up circuit mechanism in a linear voltage regulator can handle a higher supply voltage at start-up and limits the voltage seen at the devices to be lower than the maximum allowed operation voltage. The circuit may regulate voltage for operating a device coupled to a host when the host supply exceeds that necessary for device operation. The controlled start-up mechanism handles a sudden ramp up or spike of supply voltage relative to the device's operational voltage.

Abstract: A process detection circuit can detect process information in both PMOS and NMOS devices without external components or trimming. The process detection circuit may be able to identify process information on a gate-source voltage (VGS) that represents process effects. Identified process information may be used to optimize system on a chip (SoC) operation.

Abstract: A technique and corresponding circuitry are presented for a process independent, self-calibrating relaxation based clock source. The technique and circuitry presented here can reduce the time and cost needed for calibration significantly. The relaxation based clock source produces a clock signal whose frequency is dependent upon a trim value. Starting from an initial trim value, the clock signal is generated, its frequency is compared with a reference clock frequency value, and the trim value is correspondingly adjusted up or down a bit at a time. After this process has continued for a while, min-max logic is used to determine the maximum and minimum trim values and, based on these, the final trim value for the clock is set. This calibration process can also be used to extract whether, and by how much, the implementation on silicon of a particular chip lies in the fast or slow process corners.

Abstract: A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices.

Abstract: A buck power converter creates a desired output voltage from a greater input voltage with higher efficiency than linear regulators or charge pumps. For compact-size and cost sensitive products, the use of the buck power converter is hindered mainly because of lack of physical space and increases in the cost of the passive components like the inductor and capacitor. Techniques are presented to reduce the sizes of the passive components so that they can be integrated on-chip or in-package or on board. A signal converter in the buck power converter determines the duty cycle of a switching control signal. The switching control signal would ordinarily have driven a power switching circuit that provides current to the inductor in the buck power converter. The signal converter outputs a modified (multiphase) switching control signal that includes multiple separated on-periods that taken together approximate the duty cycle of the switching control signal while maintaining the same control loop frequency.

Abstract: A low drop-out (LDO) voltage regulation circuit includes first and second internal current paths. The first internal current path is between the input supply voltage and ground and includes the regulator's buffer circuit. The second internal current path is between the input supply voltage and ground and includes the regulator's power transistor. The amount of current flowing through the first internal current path relative to the amount of current flowing through the second internal current path is an increasing function of a current supplied to a load connected to the output supply node. The load regulation of the LDO is improved as the DC gain will not go down at lower load currents. Further, the no load to full load response time is improved as the load pole and power MOS gate pole are actively controlled with respect to output load current.

Abstract: A technique and corresponding circuitry are presented for a process independent, self-calibrating relaxation based clock source. The technique and circuitry presented here can reduce the time and cost needed for calibration significantly. The relaxation based clock source produces a clock signal whose frequency is dependent upon a trim value. Starting from an initial trim value, the clock signal is generated, its frequency is compared with a reference clock frequency value, and the trim value is correspondingly adjusted up or down a bit at a time. After this process has continued for a while, min-max logic is used to determine the maximum and minimum trim values and, based on these, the final trim value for the clock is set. This calibration process can also be used to extract whether, and by how much, the implementation on silicon of a particular chip lies in the fast or slow process corners.

Abstract: A technique and corresponding circuitry are presented for a process independent, self-calibrating relaxation based clock source. The technique and circuitry presented here can reduce the time and cost needed for calibration significantly. The relaxation based clock source produces a clock signal whose frequency is dependent upon a trim value. Starting from an initial trim value, the clock signal is generated, its frequency is compared with a reference clock frequency value, and the trim value is correspondingly adjusted up or down a bit at a time. After this process has continued for a while, min-max logic is used to determine the maximum and minimum trim values and, based on these, the final trim value for the clock is set. This calibration process can also be used to extract whether, and by how much, the implementation on silicon of a particular chip lies in the fast or slow process corners.

Abstract: A technique and corresponding circuitry are presented for a process independent, self-calibrating relaxation based clock source. The technique and circuitry presented here can reduce the time and cost needed for calibration significantly. The relaxation based clock source produces a clock signal whose frequency is dependent upon a trim value. Starting from an initial trim value, the clock signal is generated, its frequency is compared with a reference clock frequency value, and the trim value is correspondingly adjusted up or down a bit at a time. After this process has continued for a while, min-max logic is used to determine the maximum and minimum trim values and, based on these, the final trim value for the clock is set. This calibration process can also be used to extract whether, and by how much, the implementation on silicon of a particular chip lies in the fast or slow process corners.

Abstract: A low drop-out (LDO) voltage regulation circuit includes first and second internal current paths. The first internal current path is between the input supply voltage and ground and includes the regulator's buffer circuit. The second internal current path is between the input supply voltage and ground and includes the regulator's power transistor. The amount of current flowing through the first internal current path relative to the amount of current flowing through the second internal current path is an increasing function of a current supplied to a load connected to the output supply node. The load regulation of the LDO is improved as the DC gain will not go down at lower load currents. Further, the no load to full load response time is improved as the load pole and power MOS gate pole are actively controlled with respect to output load current.

Abstract: Techniques are presented for reducing the DC voltage shift in a voltage regulator, particularly for high and ultra-high speed load switching operation. The regulator includes a power transistor, connected between an input supply voltage and an output node, and an error amplifier, having its output connected to control the gate of the output transistor, a first input connected to receive a reference voltage, and a second input connected to a feedback node. The regulator also includes a first resistance, connected between the feedback node and ground, and also a second resistance, a third resistance, and a first capacitance, where the feedback node is connected to the output node through a combination of the first capacitance in parallel with the second resistance and in series with the third resistance.