Patents by Inventor Bhuvan Khurana

Bhuvan Khurana has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9653180
    Abstract: A system and method of writing data to a memory block includes receiving user data in a memory controller to be written to the memory block. The user data is first written to a buffer. A screening pattern is written to at least one screening column and a first memory integrity test is performed based on at least one operational aspect of the memory block. The first memory integrity test includes reading screening column data from the at least one screening column and comparing the screening column data read from the at least one screening column to the screening pattern. The user data is written to at least one user data column in the memory block when the screening column data read from the at least one screening column matches the screening pattern in the first memory integrity test.
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: May 16, 2017
    Assignee: SanDisk Technologies LLC
    Inventors: Niles Yang, Bhuvan Khurana
  • Patent number: 9583207
    Abstract: A nonvolatile memory block experiences multiple write-erase cycles during which data is subject to a shaping operation prior to storage. In response to a write-erase cycle count reaching a predetermined number, a polling cycle occurs during which shaping is disabled and data is collected that indicates a condition of the block. Subsequently, shaping is reenabled for subsequent cycles.
    Type: Grant
    Filed: February 10, 2015
    Date of Patent: February 28, 2017
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Bhuvan Khurana, Niles Yang, Jianmin Huang, Ting Luo, Idan Alrod
  • Publication number: 20160232983
    Abstract: A nonvolatile memory block experiences multiple write-erase cycles during which data is subject to a shaping operation prior to storage. In response to a write-erase cycle count reaching a predetermined number, a polling cycle occurs during which shaping is disabled and data is collected that indicates a condition of the block. Subsequently, shaping is reenabled for subsequent cycles.
    Type: Application
    Filed: February 10, 2015
    Publication date: August 11, 2016
    Inventors: Bhuvan Khurana, Niles Yang, Jianmin Huang, Ting Luo, Idan Alrod
  • Patent number: 9251891
    Abstract: A data storage device that includes a controller and a non-volatile memory may perform a method that includes comparing, in the controller, first parameter values of a first group of parameter values to second parameter values of a second group of parameter values. The second parameter values of the second group of parameter values are associated with a scheduled non-volatile memory operation. The first parameter values correspond to parameter values that are in the non-volatile memory. The method includes sending, from the controller to the non-volatile memory, a parameter value of the second group in response to determining that the parameter value differs from a corresponding parameter value of the first group.
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: February 2, 2016
    Assignee: SANDISK TECHNOLOGIES INC.
    Inventors: Ken Jianhui Hu, Nian Niles Yang, Bhuvan Khurana, Lee M. Gavens, Kulachet Tanpairoj
  • Patent number: 9236142
    Abstract: A system and method of writing data to a memory block includes receiving user data in a memory controller, the user data to be written to the memory block. The user data is first written to a buffer in the memory controller. A screening pattern is written to at least one screening column in the memory block and a first memory integrity test is performed. The first memory integrity test includes reading screening column data from the at least one screening column and comparing the screening column data read from the at least one screening column to the screening pattern. The user data is written to at least one user data column in the memory block when the screening column data read from the at least one screening column matches the screening pattern in the first memory integrity test.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: January 12, 2016
    Assignee: SanDisk Technologies Inc.
    Inventors: Niles Yang, Jianmin Huang, Bhuvan Khurana
  • Publication number: 20150318055
    Abstract: A system and method of writing data to a memory block includes receiving user data in a memory controller, the user data to be written to the memory block. The user data is first written to a buffer in the memory controller. A screening pattern is written to at least one screening column in the memory block and a first memory integrity test is performed. The first memory integrity test includes reading screening column data from the at least one screening column and comparing the screening column data read from the at least one screening column to the screening pattern. The user data is written to at least one user data column in the memory block when the screening column data read from the at least one screening column matches the screening pattern in the first memory integrity test.
    Type: Application
    Filed: May 12, 2014
    Publication date: November 5, 2015
    Applicant: SanDisk Technologies Inc.
    Inventors: Niles Yang, Jianmin Huang, Bhuvan Khurana