Patents by Inventor Bi-Cheng Wang

Bi-Cheng Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Vectors and methods for high throughput co-expressions
    Patent number: 8008016
    Abstract: The present invention includes vectors and methods for high throughput co-expression.
    Type: Grant
    Filed: July 13, 2009
    Date of Patent: August 30, 2011
    Assignee: University of Georgia Research Foundation, Inc.
    Inventors: Peter Horanyi, James Griffith, Bi-Cheng Wang, Francis E. Jenney, Jr.
  • VECTORS AND METHODS FOR HIGH THROUGHPUT CO-EXPRESSIONS
    Publication number: 20090311747
    Abstract: The present invention includes vectors and methods for high throughput co-expression.
    Type: Application
    Filed: July 13, 2009
    Publication date: December 17, 2009
    Applicant: University of Georgia Research Foundation, Inc.
    Inventors: PETER S. HORANYI, James Griffith, Bi-Cheng Wang, Francis E. Jenney, JR.
  • Vectors and methods for high throughput co-expression
    Patent number: 7582475
    Abstract: The present invention includes vectors and methods for high throughput co-expression.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: September 1, 2009
    Assignee: University of Georgia Research Foundation, Inc.
    Inventors: Peter S. Horanyi, James Griffith, Bi-Cheng Wang, Francis E. Jenney, Jr.
  • Vectors and methods for high throughput co-expression
    Publication number: 20060183193
    Abstract: The present invention includes vectors and methods for high throughput co-expression.
    Type: Application
    Filed: January 6, 2006
    Publication date: August 17, 2006
    Inventors: Peter Horanyi, James Griffith, Bi-Cheng Wang, Francis Jenney
  • Monitoring signal-to-noise ratio in x-ray diffraction data
    Publication number: 20060067470
    Abstract: The present invention relates to methods of diffractometrically determining the structures of materials by characterizing their electron density distributions. More particularly, the present invention relates to methods of collecting, processing and interpreting X-ray diffraction data, which allow real time evaluation of the signal-to-noise ratio in crystal diffraction experiments. The present methods related to the derivation of statistical indices for monitoring and evaluating signal-to-noise ratios in diffraction experiments. In addition, the present invention provides methods of determining the electron density distributions of crystals using anomalous scattering signals corrected for noise. Further, the present invention provides methods of increasing the signal-to-noise ratios in X-ray diffraction data.
    Type: Application
    Filed: July 14, 2003
    Publication date: March 30, 2006
    Inventors: Bi-Cheng Wang, Zheng-Qing Fu, John Rose
  • High-throughput methods for determining electron density distributions and structures of crystals
    Publication number: 20060029184
    Abstract: Disclosed are high-throughput methods for determining crystal structures from X-ray diffraction data, for example high-throughput crystal structure determination methods employing flexible, high-throughput modular computational pipelines, such as Bioperl computational pipelines. High-throughput methods for determining crystal structures can be fully or partially automated, and can be fully or partially computer executed. Crystal structure determination methods employing a pipeline interface, work flow manager and/or output parsers can be used to optimize the amount of structural information derived from an X-ray diffraction data set and increase the efficiency of calculating crystal structures from X-ray diffraction data.
    Type: Application
    Filed: August 26, 2005
    Publication date: February 9, 2006
    Applicant: University of Georgia Research Foundation, Inc.
    Inventors: Dawei Lin, Zhi-Jie Liu, Jeremy Praissman, John Rose, Wolfram Tempel, Bi-Cheng Wang