Abstract: Provided are an in-memory management system and method using user traffic. According to embodiments thereof, traffic bandwidth is monitored for an ERP user who has left an LAN coverage area, by using an OpenFlow-based SDN WAN, and loading or unloading of a table partition set, an SQL Plan cache, and an SQL view cache in an in-memory is managed depending on a result of monitoring, so that the in-memory can be efficiently managed. The user traffic for the ERP user and the user can be monitored through the local network, and loading or unloading of table partitions of the in-memory can be managed on the basis of the monitored user traffic so that the in-memory can be managed regardless of Internet access. Data transmission rate and security can be enhanced because distributed communication is performed over an LAN and a WAN for each user and each ERP user.

Abstract: Provided are an in-memory management system and method using user traffic. According to embodiments thereof, traffic bandwidth is monitored for an ERP user who has left an LAN coverage area, by using an OpenFlow-based SDN WAN, and loading or unloading of a table partition set, an SQL Plan cache, and an SQL view cache in an in-memory is managed depending on a result of monitoring, so that the in-memory can be efficiently managed. The user traffic for the ERP user and the user can be monitored through the local network, and loading or unloading of table partitions of the in-memory can be managed on the basis of the monitored user traffic so that the in-memory can be managed regardless of Internet access. Data transmission rate and security can be enhanced because distributed communication is performed over an LAN and a WAN for each user and each ERP user.

Abstract: According to one exemplary embodiment, a memory cell in a semiconductor chip includes a non-volatile memory transistor, a control gate, and a floating gate. The control gate is capacitively coupled to the floating gate of the non-volatile memory transistor by a metal capacitor. The metal capacitor can be formed in one or more metal levels and in one embodiment is in a shape of a comb with multiple fingers. In one embodiment, the non-volatile memory transistor is an NMOS non-volatile memory transistor.

Abstract: According to one exemplary embodiment, a memory cell in a semiconductor chip includes a non-volatile memory transistor, a control gate, and a floating gate. The control gate is capacitively coupled to the floating gate of the non-volatile memory transistor by a metal capacitor. The metal capacitor can be formed in one or more metal levels and in one embodiment is in a shape of a comb with multiple fingers. In one embodiment, the non-volatile memory transistor is an NMOS non-volatile memory transistor.

Abstract: The present invention relates to a system and method for equalizing the capacitance between/among n lines of a bus running in parallel for a portion of their length. The system and method include determining a twisting pattern for the n lines using an algorithm for example. After determining the twisting pattern forming at least n?1 twisted sections, the n lines are twisted according to the pattern so that each of the n lines runs along every other line for a same distance across the length of a bus.

Abstract: A content addressable memory cell (10) includes a circuit (20) operating from a predetermined supply voltage (VDD) for storing a first bit of data at a first point (35) and a second bit of complementary data at a second point (36). A first transistor (40) comprising a first gate (42) is switchable to first and second states in response to predetermined relationships between the first and second bits and third and fourth test bits transmitted on first and second lines (14 and 16). Second and third transistors (50, 60) comprise gates (52, 62) coupled to the first line (14) and second line (16) and comprise circuit paths (54, 56, 64, 66) coupling the first and second points to the first gate.

Abstract: A content addressable memory cell (10) includes a circuit (20) operating from a predetermined supply voltage (VDD) for storing a first bit of data at a first point (35) and a second bit of complementary data at a second point (36). A first transistor (40) comprising a first gate (42) is switchable to first and second states in response to predetermined relationships between the first and second bits and third and fourth test bits transmitted on first and second lines (14 and 16). Second and third transistors (50, 60) comprise gates (52, 62) coupled to the first line (14) and second line (16) and comprise circuit paths (54, 56, 64, 66) coupling the first and second points to the first gate.

Abstract: A content addressable memory cell (10) includes a circuit (20) operating from a predetermined supply voltage (VDD) for storing a first bit of data at a first point (35) and a second bit of complementary data at a second point (36). A first transistor (40) comprising a first gate (42) is switchable to first and second states in response to predetermined relationships between the first and second bits and third and fourth test bits transmitted on first and second lines (14 and 16). Second and third transistors (50, 60) comprise gates (52, 62) coupled to the first line (14) and second line (16) and comprise circuit paths (54, 56, 64, 66) coupling the first and second points to the first gate.

Abstract: The present invention relates to a system and method for equalizing the capacitance between at least two lines of a bus running in parallel for a portion of their length. The system and method include determining a twisting pattern for the lines using an algorithm. After determining the twisting pattern, the lines are twisted according to the pattern so that each of the lines runs along every other line for a same distance across the length of the bus.

Abstract: A content addressable memory cell (10) includes a circuit (20) operating from a predetermined supply voltage (VDD) for storing a first bit of data at a first point (35) and a second bit of complementary data at a second point (36). A first transistor (40) comprising a first gate (42) is switchable to first and second states in response to predetermined relationships between the first and second bits and third and fourth test bits transmitted on first and second lines (14 and 16). Second and third transistors (50, 60) comprise gates (52, 62) coupled to the first line (14) and second line (16) and comprise circuit paths (54, 56, 64, 66) coupling the first and second points to the first gate.

Abstract: A content addressable memory cell (10) includes a circuit (20) operating from a predetermined supply voltage (VDD) for storing a first bit of data at a first point (35) and a second bit of complementary data at a second point (36). A first transistor (40) comprising a first gate (42) is switchable to first and second states in response to predetermined relationships between the first and second bits and third and fourth test bits transmitted on first and second lines (14 and 16). Second and third transistors (50, 60) comprise gates (52, 62) coupled to the first line (14) and second line (16) and comprise circuit paths (54, 56, 64, 66) coupling the first and second points to the first gate.