Patents by Inventor Bidhan P. Chaudhuri

Bidhan P. Chaudhuri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9978147
    Abstract: A method and apparatus for performing inbuilt calibration of camera system that performs three-dimensional measurements and depth reconstruction are described. In one embodiment, the method includes displaying, using a projector of a capture device, a fiducial projection pattern in response to calibration of the capture device. The method may also include capturing, with a camera of the capture, an image of the fiducial projection pattern. The method may also include determining calibration coefficient values indicative of relative physical relationships of one or more components of the depth camera system based on analysis of the captured image of the fiducial projection pattern.
    Type: Grant
    Filed: December 23, 2015
    Date of Patent: May 22, 2018
    Assignee: INTEL CORPORATION
    Inventors: Sundeep Raniwala, Bidhan P. Chaudhuri, Anders Grunnet-Jepsen
  • Publication number: 20170186146
    Abstract: A method and apparatus for performing inbuilt calibration of camera system that performs three-dimensional measurements and depth reconstruction are described. In one embodiment, the method includes displaying, using a projector of a capture device, a fiducial projection pattern in response to calibration of the capture device. The method may also include capturing, with a camera of the capture, an image of the fiducial projection pattern. The method may also include determining calibration coefficient values indicative of relative physical relationships of one or more components of the depth camera system based on analysis of the captured image of the fiducial projection pattern.
    Type: Application
    Filed: December 23, 2015
    Publication date: June 29, 2017
    Inventors: Sundeep Raniwala, Bidhan P. Chaudhuri, Anders Grunnet-Jepsen
  • Patent number: 7317517
    Abstract: A waveguide under test can be exposed to a light signal whose polarization rotates between the vertical and horizontal polarizations. The intensity detected at a photodetector can be separated into AC and DC components. The AC components may be utilized to derive a characteristics which is indicative of birefringence of the waveguide. If the light signal is scanned over the waveguide under test, a measure of the birefringence at each position along the waveguide may be determined.
    Type: Grant
    Filed: July 31, 2003
    Date of Patent: January 8, 2008
    Assignee: Intel Corporation
    Inventors: Mahesh R. Junnarkar, Bidhan P. Chaudhuri