Abstract: In one embodiment of the invention, a method for verification of an integrated circuit design is disclosed. The method includes independently executing simulation runs in response to a plurality of coverage models to respectively generate a plurality of coverage data for a plurality of functional blocks within one or more integrated circuit designs; generating a target coverage model to selectively merge at least first coverage data associated with a first coverage model and second coverage data associated with a second coverage model; and in response to the target coverage model and the plurality of simulation runs, selectively projecting the plurality of coverage data into a merged coverage data result associated with the target coverage model. The method may further store the merged coverage data results into a storage device. The plurality of simulation runs may include at least one functional simulation run and at least one formal verification run.

Abstract: A method and apparatus for producing a verification of digital circuits are provided. In an exemplary embodiment, design and verification checksums are calculated for instances of a desired module. The design and verification checksums may be used to further derive hierarchical design and functional checksums. In another embodiment, these checksums are used to merge multiple databases produced by verification runs. In a further embodiment a computing apparatus is provided. The computing apparatus is configured to merge multiple verification databases.