Abstract: A test fixture (10) which includes a base portion (12) and upstanding successive side walls (16, 17, and 18) integral with the base portion (12). Lateral grooves (22, 24, 26) extend around the inner surface of the three side walls (16, 17, and 18). A first movable clamp 30 is positioned between opposing side walls 16 and 18 and is movable in a selected slot (22, 24, 26) toward and away from the intermediate side wall 17. A second movable clamp (80) is mounted on and movable along the first clamp 30 and extends a small distance in the direction of the intermediate side wall (17). A circuit board (90) to be tested is typically clamped between the side walls (16 and 17) and the first and second clamps (30 and 80). A test probe (130) is positioned in a holder (91) which is mounted for movement between the first and third side walls (16 and 18) and toward and away from the second intermediate side wall (17). The position of the probe holder (91) relative to the board (90) is recognized by an optics system (142).

Abstract: An extendible probe comprising an electrode and a body having two parts which cooperate to clamp the electrode in a desired position. The electrode comprises an elongated length of small diameter, electrically conducting, non-corrosive material which is electrically insulated except for the tip of one end, which is exposed and formed to a point. The two-part body has a longitudinal opening therethrough, which receives the electrode. The front part of the body, referred to as the tip, includes a tapered collett which extends away from the rear end thereof and which is compressed under pressure against the electrode, which passes therethrough. The rear part of the body, referred to as the barrel, overlays the collett and threadably engages the tip of the body. This arrangement permits controlled longitudinal movement of the barrel relative to the tip of the body.

Abstract: An apparatus for testing the operating state of single and multiple semiconductor junctions, either in or out of circuit. The tester includes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads, which are selectively connectable by a switching device to a resistance and voltage divider array, which includes means adapted to receive the junction to be tested. The output of the testing circuit is applied to a display circuit which includes a visual indicator, which in turn produces a trace having a configuration representative of the forward and reverse characteristics of the junction, for inspection by an operator. The variety of voltages available at the secondary of the transformer and the variety of resistance and voltage divider combinations available permit the safe testing of a wide variety of junctions, including multiple junctions.

Abstract: An apparatus for testing the junctions of a semiconductor while the semiconductor is in an electrical circuit. The apparatus includes a step-down transformer which operates preferably from a 120 volt AC source. A low voltage secondary winding preferably includes a common lead, a 6.5 volt lead, and a secondary tap lead between the common lead and the 6.5 volt lead. The 6.5 volt lead is connected through a low value resistance to ground. The test leads of the apparatus are connected to the secondary winding of the transformer in such a manner that a low circuit output impedance is maintained at the test leads. Connections to the horizontal and vertical inputs of a conventional oscilloscope or similar apparatus are provided through a voltage divider to the common lead and the tap lead, respectively. In operation, the pattern generated on the face of the oscilloscope in indicative of the condition of the junction of the semiconductor.