Abstract: An method, apparatus and article of manufacture for detecting and correcting memory device failures includig detecting errors in data stored in a memory device from the data transacted with a processor, correcting the detected errors in the data transacted with the processor, tracking the detected errors in the memory device, determining when the memory device has failed based upon the tracked detected errors and resetting the memory device when the memory device fails testing, and further, identifying erroneous latch-ups detected soon after powering and correcting errors such that no erroneous data is transacted with the processor.