Abstract: Provided are a CMOS structure, and fabrication methods of a FinFET CMOS, an FD CMOS and a GAA CMOS. The CMOS structure includes an nMOS and a pMOS, The nMOS includes a first channel region and a first gate electrode formed on a semiconductor substrate, and the pMOS includes a second channel region and a second gate electrode formed on the semiconductor substrate, where the first channel region and the second channel region are formed of semiconductor materials with the same conductivity type, and the first gate electrode and the second gate electrode are formed of the conductive materials with the same work function. This CMOS structure reduces the processing steps for fabricating the CMOS, thereby reducing the process complexity and the production cost, which is beneficial for improving the performance and reliability of CMOS and its integrated circuits.

Abstract: The disclosure provides a mixed-mode temperature measurement communication phase conductor and a temperature measurement communication system. The mixed-mode temperature measurement communication phase conductor includes: a stainless sleeving optical unit and a support line hinged with the stainless sleeving optical unit, wherein an aluminum wire is hinged outside the stainless sleeving optical unit and the support line; the stainless sleeving optical unit includes: multiple single-mode fibers and at least one multi-mode fiber, wherein fibers in the stainless sleeving optical unit are mutually hinged. The disclosure realizes whole-distance temperature measurement of conductor by setting the single-mode fiber to perform communication and the multi-mode fiber to perform temperature measurement.

Abstract: A method and a device for processing geological information is disclosed. The method for processing the geological information includes acquiring multiple geological image graphs, determining the relation between the image coordinate and the ground coordinate of each of the multiple geological image graphs by an imaging mode of geological images, and joining the multiple geological image graphs together according to the relation between the image coordinate and the ground coordinate of each of the multiple geological image graphs. Accordingly, large-scale ground images can be acquired by processing the geological images.

Abstract: The disclosure provides a mixed-mode temperature measurement communication phase conductor and a temperature measurement communication system. The mixed-mode temperature measurement communication phase conductor includes: a stainless sleeving optical unit and a support line hinged with the stainless sleeving optical unit, wherein an aluminium wire is hinged outside the stainless sleeving optical unit and the support line; the stainless sleeving optical unit includes: multiple single-mode fibres and at least one multi-mode fibre, wherein fibres in the stainless sleeving optical unit are mutually hinged. The disclosure realizes whole-distance temperature measurement of conductor by setting the single-mode fibre to perform communication and the multi-mode fibre to perform temperature measurement.

Abstract: Disclosed in the disclosure are a method and a device for processing geological information. The method for processing the geological information comprises: acquiring multiple geological image graphs; determining the relation between the image coordinate and the ground coordinate of each of the multiple geological image graphs by an imaging mode of geological images; and joining the multiple geological image graphs together according to the relation between the image coordinate and the ground coordinate of each of the multiple geological image graphs. The large-scale ground images can be acquired by processing the geological images according to the present disclosure.

Abstract: A cable test apparatus includes a power supply terminal, an open circuit indicator with an anode connected to the power supply terminal, a short circuit indicator, a first interface, a second interface, and a switch. The first interface and the second interface have a plurality of pins thereon. In the first interface, a first pin is connected to a cathode of the open circuit indicator, a second pin is connected to an anode of the short circuit indicator, a third pin is grounded, the other pins are shorted. The pins of the second interface are shorted as well. Therefore all wires of the cable are connected in series, even wires located at one side of the short circuit indicator, and odd wires are located at the other side of the short circuit indicator. In a short circuit test, the switch connects the second pin and a fourth pin; in an open circuit test, the switch connects the fourth pin and the cathode of the short circuit indicator and shorts the open circuit indicator.

Abstract: A cable test apparatus includes a power supply terminal, an open circuit indicator with an anode connected to the power supply terminal, a short circuit indicator, a first interface, a second interface, and a switch. The first interface and the second interface have a plurality of pins thereon. In the first interface, a first pin is connected to a cathode of the open circuit indicator, a second pin is connected to an anode of the short circuit indicator, a third pin is grounded, the other pins are shorted. The pins of the second interface are shorted as well. Therefore all wires of the cable are connected in series, even wires located at one side of the short circuit indicator, and odd wires are located at the other side of the short circuit indicator. In a short circuit test, the switch connects the second pin and a fourth pin; in an open circuit test, the switch connects the fourth pin and the cathode of the short circuit indicator and shorts the open circuit indicator.