Abstract: A displaying base plate and a manufacturing method thereof, and a displaying device. The displaying base plate includes a substrate, and a first electrode layer disposed on one side of the substrate, wherein the first electrode layer includes a first electrode pattern; a first planarization layer disposed on one side of the first electrode layer that is away from the substrate, wherein the first planarization layer is provided with a through hole, and the through hole penetrates the first planarization layer, to expose the first electrode pattern; and a second electrode layer, a second planarization layer and a third electrode layer that are disposed in stack on one side of the first planarization layer that is away from the substrate, wherein the second electrode layer is disposed closer to the substrate, the second electrode layer is connected to the first electrode pattern and the third electrode layer.

Abstract: A display substrate, a manufacturing method thereof and a display apparatus are provided. In the present disclosure, a first transistor group with oxide semiconductor as an active layer material is disposed on a side of a second transistor group with polysilicon as an active layer material away from the base, and an area enclosed by orthographic projections of the transistors in the first transistor group on the base is overlapped with an area enclosed by orthographic projections of the transistors in the second transistor group on the base. Stable performance of the transistors included can be ensured in a manufacturing process of the first transistor group and the second transistor group located in different layers, and at the same time, an area occupied by the driving circuit can be reduced so as to decrease a frame width of a display apparatus or improve resolution of the display apparatus.

Abstract: A circuit for post-binding testing of a 2.5D chiplet includes an interposer-dedicated TAP controller, an interposer test interface circuit and a chiplet test output control circuit. A chiplet test configuration register and its corresponding instructions are newly added for the interposer-dedicated TAP controller. The interposer test interface circuit uses an output control signal of the chiplet test configuration register to select the opening or closing of a test signal channel between an interposer and a chiplet. The chiplet test output control circuit uses the chiplet test configuration register to output a control signal for control of a test data output of the chiplet on the interposer.

Abstract: Method for predicting a stability of a steel cylinder including: in response to the steel cylinder tilting toward a seaward side at an arbitrary rotation point, obtaining a safety factor for the steel cylinder tilting toward the seaward side by determining an anti-tilt moment and a tilt moment when the steel cylinder is tilted to the seaward side; under a same rotation point, in response to determining that the steel cylinder is rotated toward a land side, determining the safety factor for the steel cylinder tilting toward the land side; taking a smaller safety factor as the safety factor under the rotation point; re-selecting a new rotation point, determining a safety factor corresponding to the new rotation point, and taking a safety factor with a smallest value among all rotation points as a final safety factor; and generating, based on the final safety factor, an anti-tilt instruction.

Abstract: The present disclosure discloses a flat panel detector, a driving method, a driving device and a flat panel detection device. The flat panel detector includes: a base substrate, and a plurality of detection units located on the base substrate; each of the detection units includes a photodiode and a detection transistor; the flat panel detector further includes: a compensation semiconductor material layer including a plurality of compensation structures mutually spaced; each detection transistor is correspondingly provided with a compensation structure, and the compensation structure is located between a gate and a gate insulating layer of the corresponding detection transistor.

Abstract: A computer-implemented method for recommending a large model interface configuration includes: obtaining a search space of a model interface configuration and a test data set, wherein the search space comprises at least one candidate model interface and a value range of a hyperparameter; and obtaining a plurality of model interface configuration sets based on the search space, wherein each model interface configuration set comprises a candidate model interface and a value of the hyperparameter; and obtaining a test result corresponding to each model interface configuration set, by using the test data set to test a large model called based on each model interface configuration set; and determining a target interface configuration based on the test results corresponding to the plurality of model interface configuration sets.

Abstract: A detection substrate and manufacturing method thereof, a flat panel detector and manufacturing method thereof. The detection substrate includes: a substrate including a detection region, a binding region, a controllable on-off region, and a cutting region; a plurality of detection units including transistors and photosensitive devices located in the detection region, a transistor includes a gate, a first electrode and a second electrode; a photosensitive device is connected to the first or second electrode; a plurality of conductive wires, one end is connected to the gate, and the other end is extended to the binding region; a conductive ring disposed in the cutting region; a plurality of detection wires, one end is connected to the conductive ring, the other end is connected to the conductive wires, the detection wires are passed through the controllable on-off region; the detection wires located in the controllable on-off region can have a disconnected state.

Abstract: Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.

Abstract: Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.

Abstract: The present disclosure relates to the field of design for testability of super-large-scale integrated circuits, and discloses a flexible configurable module (FCM) based chiplet test circuit. The core structure of the circuit is located at an interposer. The test circuit includes FCMs, a control signal configuration module and a test state control module, where the FCM adopts a two-way skew-symmetric structure to implement data transmission in the horizontal direction and the vertical direction; the control signal configuration module is connected to control signals of all the FCMs, so as to control the data transmission directions as well as switch on and switch off states of all the FCMs; and the test state control module controls the shift and update operations of data inside the FCMs and the control signal configuration module.

Abstract: The present disclosure relates to the field of design for testability of super-large-scale integrated circuits, and discloses a flexible configurable module (FCM) based chiplet test circuit. The core structure of the circuit is located at an interposer. The test circuit includes FCMs, a control signal configuration module and a test state control module, where the FCM adopts a two-way skew-symmetric structure to implement data transmission in the horizontal direction and the vertical direction; the control signal configuration module is connected to control signals of all the FCMs, so as to control the data transmission directions as well as switch on and switch off states of all the FCMs; and the test state control module controls the shift and update operations of data inside the FCMs and the control signal configuration module.

Abstract: Method for predicting a stability of a steel cylinder including: in response to the steel cylinder tilting toward a seaward side at an arbitrary rotation point, obtaining a safety factor for the steel cylinder tilting toward the seaward side by determining an anti-tilt moment and a tilt moment when the steel cylinder is tilted to the seaward side; under a same rotation point, in response to determining that the steel cylinder is rotated toward a land side, determining the safety factor for the steel cylinder tilting toward the land side; taking a smaller safety factor as the safety factor under the rotation point; re-selecting a new rotation point, determining a safety factor corresponding to the new rotation point, and taking a safety factor with a smallest value among all rotation points as a final safety factor; and generating, based on the final safety factor, an anti-tilt instruction.

Abstract: Sensing circuit, detection control method, fingerprint identification module and display apparatus are provided. The sensing circuit comprises a photoelectric conversion element, an energy storage circuit, a switch control circuit, a discharge control circuit and a voltage conversion circuit. The photoelectric conversion element controls potential of first terminal of energy storage circuit according to received optical signal; the switch control circuit controls first terminal of energy storage circuit to be connected to or disconnected from conversion control node; the discharge control circuit controls conversion control node be connected to or disconnected from first voltage terminal; the voltage conversion circuit controls to output voltage signal outputted by output terminal according to second and/or third voltage signals.

Abstract: Sensing circuit, detection control method, fingerprint identification module and display apparatus are provided. The sensing circuit comprises a photoelectric conversion element, an energy storage circuit, a switch control circuit, a discharge control circuit and a voltage conversion circuit. The photoelectric conversion element controls potential of first terminal of energy storage circuit according to received optical signal; the switch control circuit controls first terminal of energy storage circuit to be connected to or disconnected from conversion control node; the discharge control circuit controls conversion control node be connected to or disconnected from first voltage terminal; the voltage conversion circuit controls to output voltage signal outputted by output terminal according to second and/or third voltage signals.

Abstract: The present disclosure provides a resource allocation method and apparatus, a readable medium and an electronic device. The method includes: acquiring a target resource type corresponding to a target task; acquiring a plurality of resource types of a target processor, wherein each resource type corresponds to one or more virtual processor resources of the target processor; determining a specified resource type that is identical to the target resource type from the plurality of resource types; determining a target processor resource from one or more virtual processor resources corresponding to the specified resource type; and allocating the target processor resource to the target task.

Abstract: Method, apparatus, and system for detecting an electrode plate winding gap are provided. The method for detecting the electrode plate winding gap includes: acquiring a first width of an anode region covering a surface of the first electrode plate, a second width of a cathode region, and a third width of a protective region determined after electrode plates are cut; receiving sampled images of edges of two sides of a separator, the first electrode plate, and a second electrode plate after winding; determining a gap between the first electrode plate and the second electrode plate from the sampled images; and calculating a gap between the anode region and the cathode region as well as a gap between the anode region and the protective region according to the first width, the second width, the third width, and the gap between the first electrode plate and the second electrode plate.

Abstract: A detection substrate and manufacturing method thereof, a flat panel detector and manufacturing method thereof. The detection substrate includes: a substrate including a detection region, a binding region, a controllable on-off region, and a cutting region; a plurality of detection units including transistors and photosensitive devices located in the detection region, a transistor includes a gate, a first electrode and a second electrode; a photosensitive device is connected to the first or second electrode; a plurality of conductive wires, one end is connected to the gate, and the other end is extended to the binding region; a conductive ring disposed in the cutting region; a plurality of detection wires, one end is connected to the conductive ring, the other end is connected to the conductive wires, the detection wires are passed through the controllable on-off region; the detection wires located in the controllable on-off region can have a disconnected state.

Abstract: The disclosure discloses a test method for simulating sediment pollutant release under the effect of river channel erosion, which comprises preparing a test device, presetting a water depth and a flow velocity in a test water tank, and calculating a flow rate in the test water tank; paving the sediment in a sediment storage box, and covering an upper surface of the sediment with a water baffle; adding water into the test water tank until a preset water depth, starting a variable speed motor to drive a flow-making propeller to run to make the flow rate reach the required flow rate and keep the flow velocity constant; after the water flow becomes constant, the water baffle retracting to expose the surface of the sediment; opening sampling ports for layered sampling; measuring water; and respectively measuring concentration variation and vertical distribution features of sediment pollutant under different simulated power conditions.

Abstract: The disclosure discloses a test method for simulating sediment pollutant release under the effect of river channel erosion, which comprises preparing a test device, presetting a water depth and a flow velocity in a test water tank, and calculating a flow rate in the test water tank; paving the sediment in a sediment storage box, and covering an upper surface of the sediment with a water baffle; adding water into the test water tank until a preset water depth, starting a variable speed motor to drive a flow-making propeller to run to make the flow rate reach the required flow rate and keep the flow velocity constant; after the water flow becomes constant, the water baffle retracting to expose the surface of the sediment; opening sampling ports for layered sampling; measuring water; and respectively measuring concentration variation and vertical distribution features of sediment pollutant under different simulated power conditions.

Abstract: The present disclosure discloses a method and an apparatus for adapting a deep learning model, an electronic device and a medium, which relates to technology fields of artificial intelligence, deep learning, and cloud computing. The specific implementation plan is: obtaining model information of an original deep learning model and hardware information of a target hardware to be adapted; querying a conversion path table according to the model information and the hardware information to obtain a matched target conversion path; and converting, according to the target conversion path, the original deep learning model to an intermediate deep learning model in the conversion path, and converting the intermediate deep learning model to the target deep learning model.