Abstract: A Substrate processing apparatus including a wafer transport apparatus with a transport arm including an end effector, an arm pose deterministic feature integral to the substrate transport apparatus and disposed so that a static detection sensor of the substrate processing apparatus detects at least one edge of the at least one arm pose deterministic feature on the fly with radial motion of the transport arm, and a controller configured so that detection of the edge effects a determination of a proportion factor identifying at least a thermal expansion variance of the transport arm on the fly and includes a kinematic effects resolver configured to determine, from the detection of the edge on the fly, a discrete relation between the determined proportion factor and each different discrete variance respective to each different link of the transport arm determining at least the thermal expansion variance of the transport arm on the fly.

Abstract: A method, a device and a storage medium for evaluating speech quality include: receiving speech data to be evaluated; extracting evaluation features of the speech data to be evaluated; performing quality evaluation to the speech data to be evaluated according to the evaluation features of the speech data to be evaluated and a predetermined speech quality evaluation model, in which the speech quality evaluation model is an indication of a relationship between evaluation features of single-ended speech data and quality information of the single-ended speech data.

Abstract: A substrate transport empiric arm droop mapping apparatus for a substrate transport system of a processing tool, the mapping apparatus including a frame, an interface disposed on the frame forming datum features representative of a substrate transport space in the processing tool defined by the substrate transport system, a substrate transport arm, that is articulated and has a substrate holder, mounted to the frame in a predetermined relation to at least one of the datum features, and a registration system disposed with respect to the substrate transport arm and at least one datum feature so that the registration system registers, in an arm droop distance register, empiric arm droop distance, due to arm droop changes, between a first arm position and a second arm position different than the first arm position and in which the substrate holder is moved in the transport space along at least one axis of motion.

Abstract: A substrate transport empiric arm droop mapping apparatus for a substrate transport system of a processing tool, the mapping apparatus including a frame, an interface disposed on the frame forming datum features representative of a substrate transport space in the processing tool defined by the substrate transport system, a substrate transport arm, that is articulated and has a substrate holder, mounted to the frame in a predetermined relation to at least one of the datum features, and a registration system disposed with respect to the substrate transport arm and at least one datum feature so that the registration system registers, in an arm droop distance register, empiric arm droop distance, due to arm droop changes, between a first arm position and a second arm position different than the first arm position and in which the substrate holder is moved in the transport space along at least one axis of motion.

Abstract: A method, a device and a storage medium for evaluating speech quality include: receiving speech data to be evaluated; extracting evaluation features of the speech data to be evaluated; performing quality evaluation to the speech data to be evaluated according to the evaluation features of the speech data to be evaluated and a predetermined speech quality evaluation model, in which the speech quality evaluation model is an indication of a relationship between evaluation features of single-ended speech data and quality information of the single-ended speech data.

Abstract: A Substrate processing apparatus including a wafer transport apparatus with a transport arm including an end effector, an arm pose deterministic feature integral to the substrate transport apparatus and disposed so that a static detection sensor of the substrate processing apparatus detects at least one edge of the at least one arm pose deterministic feature on the fly with radial motion of the transport arm, and a controller configured so that detection of the edge effects a determination of a proportion factor identifying at least a thermal expansion variance of the transport arm on the fly and includes a kinematic effects resolver configured to determine, from the detection of the edge on the fly, a discrete relation between the determined proportion factor and each different discrete variance respective to each different link of the transport arm determining at least the thermal expansion variance of the transport arm on the fly.

Abstract: Substrate processing apparatus including a wafer transport apparatus with a transport arm including an end effector, an arm pose deterministic feature integral to the substrate transport apparatus and disposed so that a static detection sensor of the substrate processing apparatus detects at least one edge of the at least one arm pose deterministic feature on the fly with radial motion of the transport arm, and a controller configured so that detection of the edge effects a determination of a proportion factor identifying at least a thermal expansion variance of the transport arm on the fly and includes a kinematic effects resolver configured to determine, from the detection of the edge on the fly, a discrete relation between the determined proportion factor and each different discrete variance respective to each different link of the transport arm determining at least the thermal expansion variance of the transport arm on the fly.

Abstract: A substrate transport empiric arm droop mapping apparatus for a substrate transport system of a processing tool, the mapping apparatus including a frame, an interface disposed on the frame forming datum features representative of a substrate transport space in the processing tool defined by the substrate transport system, a substrate transport arm, that is articulated and has a substrate holder, mounted to the frame in a predetermined relation to at least one of the datum features, and a registration system disposed with respect to the substrate transport arm and at least one datum feature so that the registration system registers, in an arm droop distance register, empiric arm droop distance, due to arm droop changes, between a first arm position and a second arm position different than the first arm position and in which the substrate holder is moved in the transport space along at least one axis of motion.

Abstract: A broken tool detection mechanism applied in a CNC machine includes a base support, a first conductive elastic sheet securely mounted on the base support, and a second conductive elastic sheet. The second conductive elastic sheet is mounted on the base support, at least partially located over the first conductive elastic sheet, and spaced apart from the second conductive elastic sheet by a predetermined distance. The second conductive elastic sheet is pushed towards the first conductive elastic sheet so that the first conductive elastic sheet and the second conductive elastic sheet make electrical contact.

Abstract: Substrate processing apparatus including a wafer transport apparatus with a transport arm including an end effector, an arm pose deterministic feature integral to the substrate transport apparatus and disposed so that a static detection sensor of the substrate processing apparatus detects at least one edge of the at least one arm pose deterministic feature on the fly with radial motion of the transport arm, and a controller configured so that detection of the edge effects a determination of a proportion factor identifying at least a thermal expansion variance of the transport arm on the fly and includes a kinematic effects resolver configured to determine, from the detection of the edge on the fly, a discrete relation between the determined proportion factor and each different discrete variance respective to each different link of the transport arm determining at least the thermal expansion variance of the transport arm on the fly.

Abstract: A broken tool detection mechanism applied in a CNC machine includes a base support, a first conductive elastic sheet securely mounted on the base support, and a second conductive elastic sheet. The second conductive elastic sheet is mounted on the base support, at least partially located over the first conductive elastic sheet, and spaced apart from the second conductive elastic sheet by a predetermined distance. The second conductive elastic sheet is pushed towards the first conductive elastic sheet so that the first conductive elastic sheet and the second conductive elastic sheet make electrical contact.

Abstract: In a TDMA satellite communication system, one of the stations is elected the primary station which transmits a reference burst to all other stations to synchronize the local clocks in each station. Each subsidiary station in turn responds by transmitting a local transmit reference burst to enable synchronization of the local transmit clocks. In order to assure that the synchronous operation of the network will continue when the reference station experiences a failure, an alternate reference station is designated in the network which will assume the role of the primary reference station in a baton passing operation in the event that the existing primary reference station must abdicate its reference role. An improved method and apparatus for carrying out the baton passing operation monitors the channel error rate at the reference station and the alternate station.

Abstract: An adaptive delta modulation system is disclosed which features an improved digital compandor which may be used with a digital integrating network. The compandor executes a companding algorithm having a nonlinear characteristic to provide a rapid increase in step size to follow the fast rising start or fast decaying end of talkspurts in input signals so as to minimize any slope overload distortions and to provide a small increase or decrease in step size during the smooth portion of the talkspurts in input signals to reduce any granular noise effect. The step size generated by the compandor is directly related to the input signal level, providing a maximum companding range in which good signal-to-noise characteristics are preserved for the soft or low voiced speaker as well as for the loud voiced speaker and providing a fast transient response most suitable for telephone applications.

Abstract: An improved bucket brigade circuit is disclosed having an improved transfer efficiency and dynamic range. Conventional bucket brigade circuits consist of a chain of storage capacitors and charge transfer circuits functioning as an analog shift register. Due to the nodal capacitance at the first load of prior art circuits, the charge thereon cannot be maintained at an optimum level because of voltage pull-back and charge redistribution during the fall time of the clock pulse. The invention disclosed herein provides an additional capacitor connecting the first node of the circuit to the inverse of the clock waveform, thereby eliminating the voltage pull-back and charge redistribution problem, resulting in an improved charge transfer efficiency and dynamic range for the circuit.