Patents by Inventor Binjie Xin

Binjie Xin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050033470
    Abstract: A system and method for the three-dimensional analysis and reconstruction of the surface of a thin flexible material has a sample holder for supporting the flexible material over a curvature and a camera for capturing profile images of the surface at the curvature. The images are transferred to a computer which is programmed to extract profile height information from the images and produce three-dimensional data representing the surface of the flexible material. The profile height information is extracted by applying a histogram analysis to the images, applying a threshold, and extracting height information.
    Type: Application
    Filed: August 27, 2004
    Publication date: February 10, 2005
    Applicant: The Hong Kong Polytechnic University
    Inventors: Jinlian Hu, Binjie Xin
  • Patent number: 6842532
    Abstract: A method of three dimensional measurement, evaluation, and grading system for fabric/textile structure/garment appearance, based an values P and Q, is carried out using a fixed digital camera positioned above a piece of the fabric, shining at least two different parallel light beams from inclined directions onto the surface of the fabric and capturing different reflected images of the surface with the camera. The captured images are analysed to derive certain parameters relevant to the appearance. In particular, values of P+Q may be used in a grading evaluation, where P and Q are summations of the surface gradients for a plurality of evenly distributed points in an x direction and in a y direction of the surface, respectively.
    Type: Grant
    Filed: February 8, 2001
    Date of Patent: January 11, 2005
    Assignee: The Hong Kong Polytechnic University
    Inventors: Jinlian Hu, Binjie Xin
  • Patent number: 6728593
    Abstract: A system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device for capturing profile images of the fabric surface at the crest, and a computer system for manipulating the images. The computer system produces a three-dimensional representation of the fabric surface and identifies characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: April 27, 2004
    Assignee: The Hong Kong Polytechnic University
    Inventors: Jinlian Hu, Binjie Xin, Yueyang Guo, Edward Newton
  • Publication number: 20030229413
    Abstract: A system for analysing fabric surface appearance includes a feed mechanism for running a fabric over a crest including, a frame for holding the fabric bent to form a crest, an image capturing device to capture profile images of the fabric surface at the crest, and a computer system for manipulate the images. The computer system produces a three-dimensional representation of the fabric surface and identifies prominent characteristics in the three-dimensional representation. The information is compared to reference data to identify a grade for the fabric.
    Type: Application
    Filed: June 6, 2002
    Publication date: December 11, 2003
    Applicant: The Hong Kong Polytechnic University
    Inventors: Jinalian Hu, Binjie Xin, Yueyang Guo, Edward Newton
  • Publication number: 20020146153
    Abstract: A method of 3D measurement, evaluation and grading system for fabric/textile structure/garment appearance, based on values P and Q, is carried out using a fixed digital camera positioned above a piece of the fabric, shining at least two different parallel light beams from inclined directions on to the surface and capturing different reflected images of the surface with the camera. The captured images are analysed to derive certain parameters relevent to the appearance. In particular, values of P+Q may be used in a grading evaluation, where P and Q are summations of the surface gradients for a plurality of evenly distributed points in an x direction and in a y direction of the surface respectively.
    Type: Application
    Filed: February 8, 2001
    Publication date: October 10, 2002
    Inventors: Jinlian Hu, Binjie Xin