Patents by Inventor Binoy Jose Panakkal

Binoy Jose Panakkal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatuses for threshold voltage measurement and related semiconductor devices and systems
    Patent number: 10914780
    Abstract: A measurement circuit may include a transistor having a first terminal, a second terminal, and a third terminal, wherein the first terminal is coupled to a first reference voltage. The measurement circuit may further include a first operational amplifier including a first input coupled to the second terminal of the transistor and an output coupled to the third terminal of the transistor. The first operational amplifier may further include a second input configured to receive a second reference voltage. The measurement circuit may also include a first unity-gain voltage follower including a second operational amplifier having a first input coupled to the first input of the first operational amplifier. Methods of measuring a threshold voltage, semiconductor devices, and electronic systems are also described.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: February 9, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Binoy Jose Panakkal, Rajesh N. Gupta
  • METHODS AND APPARATUSES FOR THRESHOLD VOLTAGE MEASUREMENT AND RELATED SEMICONDUCTOR DEVICES AND SYSTEMS
    Publication number: 20200200816
    Abstract: A measurement circuit may include a transistor having a first terminal, a second terminal, and a third terminal, wherein the first terminal is coupled to a first reference voltage. The measurement circuit may further include a first operational amplifier including a first input coupled to the second terminal of the transistor and an output coupled to the third terminal of the transistor. The first operational amplifier may further include a second input configured to receive a second reference voltage. The measurement circuit may also include a first unity-gain voltage follower including a second operational amplifier having a first input coupled to the first input of the first operational amplifier. Methods of measuring a threshold voltage, semiconductor devices, and electronic systems are also described.
    Type: Application
    Filed: December 20, 2018
    Publication date: June 25, 2020
    Inventors: Binoy Jose Panakkal, Rajesh N. Gupta