Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: Observability of internal system-on-chip signals is a difficult problem and it is particularly difficult to observe and debug transactions with different clock domains. However, one embodiment provides observability of internal signals from multiple internal blocks having varying clock domains such as synchronous (common clock) and asynchronous (non common clock) domains. An embodiment provides simultaneous observability of debug data from both synchronous and asynchronous clock domains. An embodiment may also allow sending debug data from both synchronous and asynchronous domains from the SoC. One embodiment outputs internal signals on output pins of the SoC, thereby allowing transactions from one clock domain to be tracked to another clock domain and allowing for the determination of the relationship between the data of differing clock domains. Other embodiments are described herein.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.

Abstract: Observability of internal system-on-chip signals is a difficult problem and it is particularly difficult to observe and debug transactions with different clock domains. However, one embodiment provides observability of internal signals from multiple internal blocks having varying clock domains such as synchronous (common clock) and asynchronous (non common clock) domains. An embodiment provides simultaneous observability of debug data from both synchronous and asynchronous clock domains. An embodiment may also allow sending debug data from both synchronous and asynchronous domains from the SoC. One embodiment outputs internal signals on output pins of the SoC, thereby allowing transactions from one clock domain to be tracked to another clock domain and allowing for the determination of the relationship between the data of differing clock domains. Other embodiments are described herein.

Abstract: Techniques involving the transfer of signals across interconnection media are disclosed. For instance, an apparatus may include an apparatus having an interconnection medium, a first device that may drive the interconnection medium, and a second device. The second device may include a pull-up resistor that is selectively coupled between the interconnection medium and a power source. For instance, the second device may disconnect a power source from the interconnection medium when the first device is in a power saving operational state. Otherwise, the pull-up resistance is coupled between the power source and the interconnection medium.

Abstract: A front side bus swizzle mechanism modifies the front side (address and data) bus on a chip so that, when the chip is positioned on one side of a printed circuit board, connection to a second chip located on the opposite side of the printed circuit board is simplified. The simplified connection may result in less complexity and minimize the consumption of additional printed circuit board real estate.

Abstract: A front side bus swizzle mechanism modifies the front side (address and data) bus on a chip so that, when the chip is positioned on one side of a printed circuit board, connection to a second chip located on the opposite side of the printed circuit board is simplified. The simplified connection may result in less complexity and minimize the consumption of additional printed circuit board real estate.

Abstract: A system may include detection of a low signal received from a transmission line, and uncoupling of a termination circuit from the transmission line in response to the detected low signal. In some aspects, a transition of a strobe signal is then detected, and the termination circuit is coupled to the transmission line in response to the detected transition.

Abstract: A system may include detection of a low signal received from a transmission line, and uncoupling of a termination circuit from the transmission line in response to the detected low signal. In some aspects, a transition of a strobe signal is then detected, and the termination circuit is coupled to the transmission line in response to the detected transition.

Abstract: A timing model is constructed using a timing view of a functional component of a circuit under consideration. This timing view uses one or more timing elements to replace timing determinant blocks of the actual circuitry for the purposes of timing analysis. These timing elements represent signal delays from point to point in the circuit and relative timing between signals in the circuit, and thus represent the important timing characteristics of the actual circuitry. After creating the timing view of the circuit, a cross-section of the circuit comprising the functional component is simulated to produce values for delays and relative timing between signals in the circuit. These values from the circuit simulation are then attached to the various timing elements in the timing view to create the timing model for the portion of the circuit represented by the timing view.