Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

Abstract: A control logic of a switched DC-to-DC converter allows continuous switching to bring the DC-to-DC converter to a final output value during a startup phase, it allows skipping of clock switching pulses if they are not needed and allows burst mode of switching pulses dependent on a load applied to the output voltage of the DC-to-DC converter. No digital or analog regulator is required for the control logic.

Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

Abstract: Systems and methods to achieve a switched DC-to-DC converter having an improved efficiency have been disclosed. A control logic allows continuous switching to bring the DC-to-DC converter to a final output value during a startup phase, it allows skipping of clock switching pulses if they are not needed and allows burst mode of switching pulses dependent on a load applied to the output voltage of the DC-to-DC converter. No digital or analog regulator is required for the control logic.