Patents by Inventor Blane Holden

Blane Holden has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for evaluating and reporting semiconductor test processes
    Patent number: 6256593
    Abstract: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
    Type: Grant
    Filed: February 24, 2000
    Date of Patent: July 3, 2001
    Assignee: Micron Technology Inc.
    Inventors: Tim Damon, Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson
  • Method of selecting layout of integrated circuit probe card
    Patent number: 6113646
    Abstract: A probe card design method is described which optimizes the number of die probed per touchdown and minimizes the number of steps required to test an integrated circuit wafer. The method analyses rows of a wafer in sets. Assuming a specific probe card matrix, the number of touchdown steps required for each set is determined and a total number of touchdown steps required for the wafer is determined. This method is repeated for a plurality of probe card matrixes. The size of the first set can be varied to determine an optimum offset which reduces the number of touchdown steps required to test the wafer. Each set is analyzed by dividing the longest row of the set by the width of the probe card matrix and rounding a result up to the nearest integer. The result of each set is summarized to indicate a minimum number of touchdowns required to test a wafer.
    Type: Grant
    Filed: December 4, 1997
    Date of Patent: September 5, 2000
    Assignee: Micron Technology, Inc.
    Inventor: Blane Holden
  • System for evaluating and reporting semiconductor test processes
    Patent number: 6070131
    Abstract: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: May 30, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Tim Damon, Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson