Abstract: A method for processing a lot of semiconductor wafers in a semiconductor factory automation (FA) system, wherein the lot is defined as a predetermined number of semiconductor wafers, includes the steps of: a) determining whether a first process equipment operable at a first operating mode has a job file corresponding to the lot of semiconductor wafers, wherein the job file represents data required for a semiconductor process; b) if the first process equipment operable at the first operating mode has the job file, processing the lot of semiconductor wafers according to the job file in the first process equipment; c) if the first process equipment operable at the first operating mode has not the job file, providing the job file to a second process equipment operable at a second operating mode; and d) processing the lot of semiconductor wafers according to the job file in the second process equipment.

Abstract: A method for resetting a process recipe in a semiconductor factory automation (FA) system, includes the steps of: a) sending the process recipe and a lot identifier inputted from an operator to a process equipment, wherein the process recipe represents a set of semiconductor process conditions corresponding to a lot of semiconductor wafers and the lot identifier corresponds to the lot of semiconductor wafers; b) processing the lot of semiconductor wafers according to the process recipe; c) measuring the processed lot of semiconductor wafers to generate semiconductor measurement data; d) writing the semiconductor measurement data to a trace file, wherein the trace file includes the process recipe, the semiconductor measurement data and the lot identifier; e) retrieving the semiconductor measurement data contained in the trace file in response to a retrieval command inputted from the operator; and f) resetting the process recipe in response to a reset command inputted from the operator if the process recipe is