Abstract: A container adapter includes a soft sleeve having a first and a second anti-slide sleeve portion; a rigid connecting pipe having a coupling portion, a stop portion and a plurality of slots. The first anti-slide sleeve portion is forward tapered, and the coupling portion is backward flared. The rigid connecting pipe is connected at the coupling portion to the first anti-slide sleeve portion of the soft sleeve with the stop portion abutted on a rim of the first anti-slide sleeve portion. To use the container adapter, simply fit the second anti-slide sleeve portion of the soft sleeve around an end of a container. Decorative accessories can be set in the slots to form ornaments, or pipes can be connected to the container adapter to form a fluid passage for guiding a liquid in the container, such that the container can have more applications and be advantageous to environmental protection.

Abstract: An design architecture for an application specific integrated circuit (ASIC) is disclosed. The design architecture of the ASIC includes a pre-determined number of redundant computational units such that when defective computational units are found during testing, full functionality of the ASIC is maintained by re-mapping functionality from the defective units to the once redundant units. The marking of defective units and the re-mapping of functionality are automated by using self-test logic built into each computational unit in the ASIC. The self-test logic is adapted to allow the corresponding computational unit to self-isolate itself from the data initialization process and to self-disable to avoid any computation when the ASIC is in operation mode. The re-mapping of functionality is achieved by initializing the computational units in the array in a serial manner.

Abstract: An design architecture for an application specific integrated circuit (ASIC) is disclosed. The design architecture of the ASIC includes a pre-determined number of redundant computational units such that when defective computational units are found during testing, full functionality of the ASIC is maintained by re-mapping functionality from the defective units to the once redundant units. The marking of defective units and the re-mapping of functionality are automated by using self-test logic built into each computational unit in the ASIC. The self-test logic is adapted to allow the corresponding computational unit to self-isolate itself from the data initialization process and to self-disable to avoid any computation when the ASIC is in operation mode. The re-mapping of functionality is achieved by initializing the computational units in the array in a serial manner.