Abstract: An actuator device aligns an optical element of a projection exposure apparatus. The actuator device includes a shaft. The first end portion of the shaft is deflectably suspended from a base point of a supporting structure by way of a joint. The second end portion of the shaft is fixed on the optical element. At least one actuator unit has a translator fixed on the shaft and a stator mechanically connected to the supporting structure to apply a deflection force to the shaft to radially deflect the shaft from a middle position.

Abstract: An actuator device aligns an optical element of a projection exposure apparatus. The actuator device includes a shaft. The first end portion of the shaft is deflectably suspended from a base point of a supporting structure by way of a joint. The second end portion of the shaft is fixed on the optical element. At least one actuator unit has a translator fixed on the shaft and a stator mechanically connected to the supporting structure to apply a deflection force to the shaft to radially deflect the shaft from a middle position.

Abstract: An optical unit, in particular a facet mirror unit, includes an optical element and a supporting device. The optical element has an optical surface, in particular an elongate optical surface, which defines a plane of main extension and a direction of main extension in the plane of main extension. The supporting device includes a supporting unit and an actuator unit. The actuator unit is configured for tilting the optical surface, in that a tilting moment is exerted on the optical element by way of the actuator unit. The tilting moment runs in an inclined manner in relation to the plane of main extension. The supporting unit is configured to predefine a tilting axis for the optical surface that lies substantially in the plane of main extension of the optical surface when there is tilting of the optical surface by the tilting moment of the actuator unit.

Abstract: An optical unit, in particular a facet mirror unit, includes an optical element and a supporting device. The optical element has an optical surface, in particular an elongate optical surface, which defines a plane of main extension and a direction of main extension in the plane of main extension. The supporting device includes a supporting unit and an actuator unit. The actuator unit is configured for tilting the optical surface, in that a tilting moment is exerted on the optical element by way of the actuator unit. The tilting moment runs in an inclined manner in relation to the plane of main extension. The supporting unit is configured to predefine a tilting axis for the optical surface that lies substantially in the plane of main extension of the optical surface when there is tilting of the optical surface by the tilting moment of the actuator unit.

Abstract: An optical unit, in particular a facet mirror unit, includes an optical element and a supporting device. The optical element has an optical surface, in particular an elongate optical surface, which defines a plane of main extension and a direction of main extension in the plane of main extension. The supporting device includes a supporting unit and an actuator unit. The actuator unit is configured for tilting the optical surface, in that a tilting moment is exerted on the optical element by way of the actuator unit. The tilting moment runs in an inclined manner in relation to the plane of main extension. The supporting unit is configured to predefine a tilting axis for the optical surface that lies substantially in the plane of main extension of the optical surface when there is tilting of the optical surface by the tilting moment of the actuator unit.

Abstract: An optical unit, in particular a facet mirror unit, includes an optical element and a supporting device. The optical element has an optical surface, in particular an elongate optical surface, which defines a plane of main extension and a direction of main extension in the plane of main extension. The supporting device includes a supporting unit and an actuator unit. The actuator unit is configured for tilting the optical surface, in that a tilting moment is exerted on the optical element by way of the actuator unit. The tilting moment runs in an inclined manner in relation to the plane of main extension. The supporting unit is configured to predefine a tilting axis for the optical surface that lies substantially in the plane of main extension of the optical surface when there is tilting of the optical surface by the tilting moment of the actuator unit.

Abstract: An illumination optical system for EUV microlithography is used to direct an illumination light beam from a radiation source to an object field. At least one EUV mirror has a reflective face with a nonplanar mirror topography for forming the illumination light beam. The EUV mirror has at least one EUV attenuator arranged in front of it. The attenuator face which faces the reflective face of the EUV mirror has an attenuator topography which is designed to complement the mirror topography such that at least sections of the attenuator face are arranged at a constant interval from the reflective face. The result is an illumination optical system in which it is possible to correct unwanted variations in illumination parameters, for example an illumination intensity distribution or an illumination angle distribution, over the object field with as few unwanted radiation losses as possible.

Abstract: The invention relates to an optical element for a projection exposure apparatus for semiconductor lithography comprising an optically active surface and at least one cooling component for cooling the optical element, wherein the cooling component is connected to at least two separate cooling circuits and embodied in such a way that the optically active surface can be cooled to a greater extent in at least one partial region than in a further partial region. The invention furthermore relates to a projection exposure apparatus comprising an optical element according to the invention.

Abstract: A hexapod system is provided for aligning an optical element in semiconductor clean rooms or in a vacuum, particularly in an illumination device for a microlithographic EUV projection exposure apparatus. The system includes six hexapod supporting structures. Using a set of at least two replaceable spacer elements having a different extent in at least one direction, at least one of the six supporting structures can be adjusted. The latter is adapted so that a spacer element can be removed or a spacer element can be added while the coupling of the first coupling end to the carrying structure and the coupling of the second coupling end to the optical element are maintained. A method for aligning an optical element in semiconductor clean rooms or in a vacuum including using a hexapod system is provided.

Abstract: The invention relates to a mirror arrangement, in particular for use in a microlithographic projection exposure apparatus, comprising a plurality of individual mirrors and a plurality of flexures, wherein each individual mirror is tiltable about at least one tilting axis via one of the flexures and wherein the flexures are integrated into a common component.

Abstract: The invention relates to an optical element for a projection exposure apparatus for semiconductor lithography comprising an optically active surface and at least one cooling component for cooling the optical element, wherein the cooling component is connected to at least two separate cooling circuits and embodied in such a way that the optically active surface can be cooled to a greater extent in at least one partial region than in a further partial region. The invention furthermore relates to a projection exposure apparatus comprising an optical element according to the invention.

Abstract: A device for an optical arrangement includes an optical element and a holding structure. The optical element makes contact with the holding structure at six discrete contact points. Coupling elements are provided, by which it is possible to apply a force at the contact points. A component of the force is greater than the weight force of the optical element in terms of absolute value and/or direction.

Abstract: An illumination optical system for EUV microlithography is used to direct an illumination light beam from a radiation source to an object field. At least one EUV mirror has a reflective face with a nonplanar mirror topography for forming the illumination light beam. The EUV mirror has at least one EUV attenuator arranged in front of it. The attenuator face which faces the reflective face of the EUV mirror has an attenuator topography which is designed to complement the mirror topography such that at least sections of the attenuator face are arranged at a constant interval from the reflective face. The result is an illumination optical system in which it is possible to correct unwanted variations in illumination parameters, for example an illumination intensity distribution or an illumination angle distribution, over the object field with as few unwanted radiation losses as possible.

Abstract: A device for an optical arrangement includes an optical element and a holding structure. The optical element makes contact with the holding structure at six discrete contact points. Coupling elements are provided, by which it is possible to apply a force at the contact points. A component of the force is greater than the weight force of the optical element in terms of absolute value and/or direction.