Abstract: An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body member having an opening; an optical positioner located within the opening; and at least one X-ray optic and an optical viewing lens coupled to a first camera. The at least one X-ray optic and the optical viewing lens are secured to the optical positioner. The optical positioner is configured to align one of the at least one X-ray optic and the optic viewing lens normal to the sample on the sample stage such that the sample is irradiated with X-rays through the X-ray optic along a path which is normal to the sample and coaxial with the optic viewing lens receiving light reflected from the sample when the optic viewing lens is positioned normal to the sample.

Abstract: An apparatus for the indirect cooling of a silicon drift detector (SDD) includes an enclosure with a vacuum maintained therein, at least one SDD module that generates substantially no heat positioned within the enclosure, a cooling engine positioned remote from the SDD module within the enclosure for cooling the SDD module, whereby heat is generated by the cooling engine, a thermal conduction device comprising a first end thermally coupled to the cooling engine and a second end thermally coupled to the SDD module and a heat removal device thermally coupled to the cooling engine. The cooling engine indirectly cools the SDD module by transferring thermal energy through the thermal conduction device from the SDD module and the heat removal device dissipates the heat generated by the cooling engine to the environment surrounding the enclosure. A method for indirectly cooling a radiation detector is also provided.