Patents by Inventor Bogdan Szfraniec

Bogdan Szfraniec has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6646746
    Abstract: An optical heterodyne detection system in accordance with an embodiment of the invention includes two optical receivers for separately measuring the power of an input signal and a local oscillator signal before the signals are combined. The measurements of the input signal and the local oscillator signal are then utilized to enhance the heterodyne signal to noise ratio by removing the intensity noise contributed by the input signal and the local oscillator signal. By measuring portions of the input signal power and the local oscillator signal power and then subtracting out the scaled quantities from the photocurrent measurement during signal processing, the signal to noise of the heterodyne signal is improved beyond that which is accomplished by known balanced receivers.
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: November 11, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Wayne V. Sorin, Bogdan Szfraniec, Douglas M. Baney
  • Publication number: 20020176089
    Abstract: A system and method for measuring the group delay of an optical device under test (DUT) utilizes an optical frequency counter in conjunction with a test interferometer to compensate for the non-uniform frequency changes of an input optical signal used by the test interferometer to measure the group delay. The group delay of the optical DUT is measured using the zero-crossings of an AC coupled heterodyne beat signal produced by the test interferometer from the input optical signal. In the measurement of the group delay, phase changes in the heterodyne beat signal caused by the non-uniform frequency changes of the input optical signal are compensated by using the measured optical frequency of the input optical signal. The optical frequency is detected by the optical frequency counter. The detected optical frequency is indicative of the non-uniform frequency changes of the input optical signal.
    Type: Application
    Filed: May 8, 2001
    Publication date: November 28, 2002
    Inventors: Bogdan Szfraniec, Douglas M. Baney
  • Patent number: 6486961
    Abstract: A system and method for measuring the group delay of an optical device under test (DUT) utilizes an optical frequency counter in conjunction with a test interferometer to compensate for the non-uniform frequency changes of an input optical signal used by the test interferometer to measure the group delay. The group delay of the optical DUT is measured using the zero-crossings of an AC coupled heterodyne beat signal produced by the test interferometer from the input optical signal. In the measurement of the group delay, phase changes in the heterodyne beat signal caused by the non-uniform frequency changes of the input optical signal are compensated by using the measured optical frequency of the input optical signal. The optical frequency is detected by the optical frequency counter. The detected optical frequency is indicative of the non-uniform frequency changes of the input optical signal.
    Type: Grant
    Filed: May 8, 2001
    Date of Patent: November 26, 2002
    Assignee: Agilent Technologies, Inc.
    Inventors: Bogdan Szfraniec, Douglas M. Baney