Abstract: A readout circuit for an image sensor is disclosed. At least one column amplifier (CA) generates a CA reset signal when the column amplifier is reset. A capacitor and a switch are configured to receive a column of the image sensor. A multiplexer is coupled between (a) the capacitor and the switch and (b) an input of the column amplifier. A correlated double sampling (CDS) circuit is used for controllably receiving an output of the column amplifier.

Abstract: A binning circuit and method for an image sensor is disclosed. A column amplifier (CA) is first reset, and thus generates a CA reset signal. A capacitor and a switch network are coupled between an output of the image sensor and an input of the column amplifier. A correlated double sampling (CDS) circuit controllably receives the output of the column amplifier. The switch network is controlled in a way such that an image signal of a first group of the image sensor is transmitted and stored in the CDS circuit, and an image signal of a second group is then added to the stored image signal of the first group.

Abstract: A black level compensation (BLC) circuit is disclosed. The BLC circuit includes a switched-capacitor (SC) integrator configured to compensate a readout amplifier of an image sensor. An output of the readout amplifier is clamped to a reference voltage at which a black level of the image sensor is defined. According to one aspect, a bad pixel detector is used to detect a bad pixel or pixels and disconnect the BLC loop when the bad pixel or pixels are detected.

Abstract: A black level compensation (BLC) circuit is disclosed. The BLC circuit includes a switched-capacitor (SC) integrator configured to compensate a readout amplifier of an image sensor. An output of the readout amplifier is clamped to a reference voltage at which a black level of the image sensor is defined. According to one aspect, a bad pixel detector is used to detect a bad pixel or pixels and disconnect the BLC loop when the bad pixel or pixels are detected.

Abstract: A binning circuit and method for an image sensor is disclosed. A column amplifier (CA) is first reset, and thus generates a CA reset signal. A capacitor and a switch network are coupled between an output of the image sensor and an input of the column amplifier. A correlated double sampling (CDS) circuit controllably receives the output of the column amplifier. The switch network is controlled in a way such that an image signal of a first group of the image sensor is transmitted and stored in the CDS circuit, and an image signal of a second group is then added to the stored image signal of the first group.

Abstract: A readout circuit for an image sensor is disclosed. At least one column amplifier (CA) generates a CA reset signal when the column amplifier is reset. A capacitor and a switch are configured to receive a column of the image sensor. A multiplexer is coupled between (a) the capacitor and the switch and (b) an input of the column amplifier. A correlated double sampling (CDS) circuit is used for controllably receiving an output of the column amplifier.