Patents by Inventor Bojan R. Ilic

Bojan R. Ilic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanned probe microscopy (SPM) probe having angled tip
    Patent number: 8893310
    Abstract: A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.
    Type: Grant
    Filed: July 2, 2012
    Date of Patent: November 18, 2014
    Assignees: International Business Machines Corporation, Cornell University
    Inventors: Mark C. Reuter, Brian A. Bryce, Bojan R. Ilic, Sandip Tiwari
  • Scanned Probe Microscopy (SPM) Probe Having Angled Tip
    Publication number: 20140007308
    Abstract: A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.
    Type: Application
    Filed: July 2, 2012
    Publication date: January 2, 2014
    Applicants: CORNELL UNIVERSITY, INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mark C. Reuter, Brian A. Bryce, Bojan R. Ilic, Sandip Tiwari
  • Scanned probe microscopy (SPM) probe having angled tip
    Patent number: 8539611
    Abstract: A method of creating a probe for scanned probe microscopy is disclosed. The method includes providing a wafer having a support wafer layer and a device layer. The method includes masking the wafer with a masking layer. The method includes removing a portion of the masking layer at the device layer. The method includes etching the wafer along the portion of the masking layer that has been removed to create a crystal facet surface that is oriented at a tilt angle. The method includes epitaxially growing a tip along the crystal facet surface.
    Type: Grant
    Filed: July 12, 2012
    Date of Patent: September 17, 2013
    Assignees: International Business Machines Corporation, Cornell University
    Inventors: Mark C. Reuter, Brian A. Bryce, Bojan R. Ilic, Sandip Tiwari
  • RESONANT MATERIAL LAYER APPARATUS, METHOD AND APPLICATIONS
    Publication number: 20130062104
    Abstract: A resonant structure and a method for fabricating the resonant structure each include a substrate that includes at least one cavity. The resonant structure and the method for fabricating the resonant structure also include a resonant material layer located and formed over the substrate and at least in-part covering the at least one cavity. The resonant structure may comprise a graphene resonator structure.
    Type: Application
    Filed: September 7, 2012
    Publication date: March 14, 2013
    Applicant: Cornell University - Cornell Center for Technology Enterprise & Commercialization (CCTEC)
    Inventors: Harold G. Craighead, Jeevak M. Parpia, Paul McEuen, Jiwoong Park, Jonathan S. Alden, Robert A. Barton, Bojan R. Ilic, Carlos S. Ruiz-Vargas, Arend M. van der Zande