Abstract: The present invention provides providing a substrate, forming a sensor array on the substrate, forming a structured array of uncommitted logic surrounding the sensor array on the substrate, and providing electrical interconnects to the structured array of uncommitted logic, wherein the structured array of uncommitted logic forms functions that support the operation of the sensor array.

Abstract: Disclosed are various embodiments of methods and corresponding devices for effecting such methods that permit integrated circuits, sensors, chips or dies to be identified. Imperfections or irregularities in pixels or memory cells are used to generate identification codes for integrated circuits, sensors, chips or dies. Addresses or data locations of selected defective pixels or memory cells may be used to generate such identification codes.

Abstract: A digital image sensor comprising an array of pixels and a processor is provided. The array of pixels comprises a current pixel in a first color plane that is configured to produce a current sensor value, a first plurality of pixels in the first color plane that is configured to produce a first plurality of sensor values, and a second plurality of pixels in the second color plane that is configured to produce a second plurality of sensor values. The processor is configured to generate a plurality of estimate values using the first plurality of sensor values and a plurality of intensity ratios associated with the second plurality of sensor values, and the processor is configured to determine whether the current pixel is defective using the plurality of estimate values and the current sensor value.

Abstract: A bad pixel correction (BPC) algorithm that can be implemented on the image sensor chip is provided for detecting and correcting defective pixels in a digital color image sensor. Gradients of neighboring pixels in at least one other color plane than the color plane of a current pixel and a range of sensor values from neighboring pixels in the same color plane as the current pixel are determined. If the sensor value of the current pixel is outside of the range by a threshold amount that is calculated using one or more of the gradients, the current pixel is determined to be a defective pixel, and replaced using the sensor values of the neighboring pixels in the same color plane.

Abstract: A bad pixel correction (BPC) algorithm that can be implemented on the image sensor chip is provided for detecting and correcting defective pixels in a digital color image sensor. Gradients of neighboring pixels in at least one other color plane than the color plane of a current pixel and a range of sensor values from neighboring pixels in the same color plane as the current pixel are determined. If the sensor value of the current pixel is outside of the range by a threshold amount that is calculated using one or more of the gradients, the current pixel is determined to be a defective pixel, and replaced using the sensor values of the neighboring pixels in the same color plane.