Abstract: An assembly comprises a connector and a sleeve. The connector includes a resilient locking member movable between an outwardly disposed locked position and an inwardly disposed unlocked position. The resilient locking member includes a button portion and a locking projection. A sleeve includes an aperture capable of engaging with the button portion of the resilient locking member. The sleeve is capable of sliding along the body of the connector and pushing down the button portion to unlock the resilient locking member so as to disengage the connector from its receptacle. The assembly further comprises a pair of stoppers provided on the sleeve and a pair of grooves provided on the connector. The pair of stoppers is engagable with the corresponding pair of grooves so that the connector is pulled out from the receptacle when a user continues to pull the sleeve backward after unlocking the resilient locking member.

Abstract: An assembly comprises a connector and a sleeve. The connector includes a resilient locking member movable between an outwardly disposed locked position and an inwardly disposed unlocked position. The resilient locking member includes a button portion and a locking projection. A sleeve includes an aperture capable of engaging with the button portion of the resilient locking member. The sleeve is capable of sliding along the body of the connector and pushing down the button portion to unlock the resilient locking member so as to disengage the connector from its receptacle. The assembly further comprises a pair of stoppers provided on the sleeve and a pair of grooves provided on the connector. The pair of stoppers is engagable with the corresponding pair of grooves so that the connector is pulled out from the receptacle when a user continues to pull the sleeve backward after unlocking the resilient locking member.

Abstract: A test structure for measuring bond pad quality is presented. The test structure includes a metal element that is defined over a dielectric layer. The metal element is then covered by a passivation layer, which has a number of probe points that exposes the top surface of the metal element. In addition, the top surface of the metal element is exposed between a pair of adjacent probe points.