Abstract: A shielding arrangement for a coating thickness device utilizing the radiation backscatter technique. An isotope housing is provided having an aperture through which radiation can pass. A removable cover shield is attached to the housing to cover the aperture when the device is not in use. Means are provided to remotely remove the cover shield from the housing and expose the aperture. A secondary shield carried by the device is provided to swing into and out of covering relationship to the aperture to block radiation passage through the aperture between measurements. The secondary shield is operatively connected with the operating handle of the device to coordinate movement of the secondary shield with the position of the isotope housing. A tertiary shield, which can be of transparent plastic material, is provided between the measuring zone of the device and the operator to provide additional shielding during the times the secondary shield is not in covering relationship with the aperture.

Abstract: A device especially adapted for measuring the thickness of coatings on small, complexly-shaped parts, such as, for example, electronic connectors, electronic contacts, or the like. The device includes a source of beta radiation and a radiation detector whereby backscatter of the radiation from the coated part can be detected and the thickness of the coating ascertained. The radiation source and detector are positioned in overlying relationship to the coated part and a microscope is provided to accurately position the device with respect to the part. Means are provided to control the rate of descent of the radiation source and radiation detector from its suspended position to its operating position and the resulting impact it makes with the coated part to thereby promote uniformity of readings from operator to operator, and also to avoid excessive impact with the part, thereby improving accuracy of measurement and eliminating damage to the parts.

Abstract: A portable device for measuring coating thickness incorporating a radioactive isotope source and a detector. The device is capable of being readily moved from place to place to measure the thickness of thin film coatings applied to various types of substrates, and incorporates spring means for bringing the isotope source holder into intimate contact with the area to be measured and for holding it in that position. The device also includes a locating system whereby a cross-hair or other image is projected onto the surface of the coating the thickness of which is to be measured, at the point where the source holder would contact the coating surface, permitting extremely accurate locating of the device with respect to the area being measured to thereby facilitate the measuring operation and to permit it to be done in an accurate, speedy, and efficient manner.

Abstract: A system for the radiation backscatter measurement of coating thicknesses has a stand for supporting a workpiece, and a probe body removably mounted on the stand and carrying a radiation source, a radiation detector and a sighting device, the probe body being vertically adjustable on the stand to selectively vary the height of the workpiece-receiving throat. The probe body is self-supporting independently of the stand on a workpiece or other supporting surface and can be inverted to provide its own workpiece support, being self-supporting when inverted. The source and detector are movable simultaneously as a unit with the sighting device to position first one and then the other in operative alinement with the axis of measurement.

Abstract: A method and apparatus using radiation techniques for measuring coating thicknesses on continuously moving strip material as it travels along a predetermined path and without altering that path. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided in the path of the strip for reciprocation along a preselected segment of the path. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the direction of travel of the strip during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism.