Abstract: In one embodiment, a field programmable gate array (FPGA) includes: at least one programmable logic circuit to execute a function programmed with a bitstream; a self-test circuit to execute a self-test at a first voltage, the self-test and the first voltage programmed with first metadata associated with the bitstream, the self-test including at least one critical path length of the function; and a power controller to identify an operating voltage for the at least one programmable logic circuit based at least in part on the execution of the self-test at the first voltage.

Abstract: In one embodiment, a field programmable gate array (FPGA) includes: at least one programmable logic circuit to execute a function programmed with a bitstream; a self-test circuit to execute a self-test at a first voltage, the self-test and the first voltage programmed with first metadata associated with the bitstream, the self-test including at least one critical path length of the function; and a power controller to identify an operating voltage for the at least one programmable logic circuit based at least in part on the execution of the self-test at the first voltage. Other embodiments are described and claimed.

Abstract: An apparatus is provided, comprising: a first circuitry configured to generate a signal at a voltage level for one or more components; a second circuitry configured to generate a clock at a frequency level for the one or more components; a third circuitry configured to intermittently measure a current level of the signal; a fourth circuitry configured to estimate a first average of the current level of the signal over a first time-window; and a fifth circuitry configured to, in response to the first average being higher than a threshold average current, facilitate regulating one or both the voltage level of the signal or the frequency level of the clock.