Patents by Inventor Boris Stowasser

Boris Stowasser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100061589
    Abstract: In order to improve the image quality of X-ray detectors, a method for determining the temperature of a digital X-ray detector with a scintillator and a pixel matrix of photodiodes is provided at least one point of the X-ray detector. According to the method a reverse voltage is applied to at least a first photodiode, the reverse current of the at least first photodiode is measured, and the temperature of the X-ray detector at the first photodiode is determined from the reverse current.
    Type: Application
    Filed: August 31, 2009
    Publication date: March 11, 2010
    Inventors: Gerhard Hahm, Boris Stowasser
  • Publication number: 20090097732
    Abstract: The invention relates to a method for presentation of medical images by a reproduction facility of a diagnostic device with suppression of the noise with the following steps: one-off calibration of the signal-dependent noise; separation of the signal and noise components in the image; adaptation of the two components according to set parameters; and composition of the signals.
    Type: Application
    Filed: September 26, 2008
    Publication date: April 16, 2009
    Inventors: Stefan Bohm, Peter Durlak, Boris Stowasser
  • Patent number: 7119327
    Abstract: For the comparatively simple and precise correction of an X-ray image (RB) recorded by a digital X-ray detector (3) with comparatively little calibration, at least one gain image (G0,G1,G2) is selected from a plurality of stored gain images (G) for linking to the X-ray image (R) based on at least one parameter (Pi) characterizing the recording conditions of the X-ray image (RB), whereby the gain images (G) are stored such that they differ at least in respect of one parameter (Pi) used for the selection and whereby the selection of the at least one gain image (G0,G1,G2) is made based on the distance (d) between the parameter configuration (g0,g1,g2) of the gain image (G0,G1,G2) and the parameter configuration (p) of the X-ray image (RB) in a parameter space (35) set by the parameters (Pi).
    Type: Grant
    Filed: September 17, 2004
    Date of Patent: October 10, 2006
    Assignee: Siemens Aktiengesellschaft
    Inventors: Martin Spahn, Boris Stowasser
  • Publication number: 20050061963
    Abstract: For the comparatively simple and precise correction of an X-ray image (RB) recorded by a digital X-ray detector (3) with comparatively little calibration, at least one gain image (G0,G1,G2) is selected from a plurality of stored gain images (G) for linking to the X-ray image (R) based on at least one parameter (Pi) characterizing the recording conditions of the X-ray image (RB), whereby the gain images (G) are stored such that they differ at least in respect of one parameter (Pi) used for the selection and whereby the selection of the at least one gain image (G0,G1,G2) is made based on the distance (d) between the parameter configuration (g0,g1,g2) of the gain image (G0,G1,G2) and the parameter configuration (p) of the X-ray image (RB) in a parameter space (35) set by the parameters (Pi).
    Type: Application
    Filed: September 17, 2004
    Publication date: March 24, 2005
    Inventors: Martin Spahn, Boris Stowasser
  • Patent number: 6655836
    Abstract: In an X-ray diagnostic installation and correction method wherein comet artifacts in the unprocessed image can be corrected, a geometrical analysis of the comet artifacts is implemented, an estimated reference value is determined from the original signal using the analysis result, an estimated detail signal is determined from the original signal using the analysis result, and the comet artifacts are corrected on the basis of the estimated reference value and the estimated detail signal.
    Type: Grant
    Filed: February 13, 2002
    Date of Patent: December 2, 2003
    Assignee: Siemens Aktiengesellschaft
    Inventors: Stefan Boehm, Martin Spahn, Boris Stowasser
  • Publication number: 20020150216
    Abstract: In an X-ray diagnostic installation and correction method wherein comet artifacts in the unprocessed image can be corrected, a geometrical analysis of the comet artifacts is implemented, an estimated reference value is determined from the original signal using the analysis result, an estimated detail signal is determined from the original signal using the analysis result, and the comet artifacts are corrected on the basis of the estimated reference value and the estimated detail signal.
    Type: Application
    Filed: February 13, 2002
    Publication date: October 17, 2002
    Inventors: Stefan Boehm, Martin Spahn, Boris Stowasser