Abstract: A system for testing an application-specific integrated circuit, includes a characterization integrated circuit comprising at least two configurable test structures and a test assembly comprising: a device for controlling the characterization integrated circuit, configured to vary at least one physical parameter of at least one configurable test structure, an interface for receiving at least one description of an application-specific integrated circuit and extracting at least one path, a configuration device for activating and interconnecting at least one subset of the logic cells of at least one degraded test structure and of at least one non-degraded test structure, so that they each produce a topology identical to a portion of an extracted path, a measurement control device for performing at least one first measurement of a physical variable on the degraded test structure and at least one second measurement, identical to the first measurement, on the non-degraded test structure.

Abstract: A system for testing an application-specific integrated circuit, includes a characterization integrated circuit comprising at least two configurable test structures and a test assembly comprising: a device for controlling the characterization integrated circuit, configured to vary at least one physical parameter of at least one configurable test structure, an interface for receiving at least one description of an application-specific integrated circuit and extracting at least one path, a configuration device for activating and interconnecting at least one subset of the logic cells of at least one degraded test structure and of at least one non-degraded test structure, so that they each produce a topology identical to a portion of an extracted path, a measurement control device for performing at least one first measurement of a physical variable on the degraded test structure and at least one second measurement, identical to the first measurement, on the non-degraded test structure.