Patents by Inventor Boung-Lyoul Jung

Boung-Lyoul Jung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device having contact failure detector
    Patent number: 7622940
    Abstract: A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.
    Type: Grant
    Filed: July 24, 2008
    Date of Patent: November 24, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Gwang-Young Kim, Jong-Youb Kim, Boung-Lyoul Jung, Joon-Su Ji
  • SEMICONDUCTOR DEVICE HAVING CONTACT FAILURE DETECTOR
    Publication number: 20090039909
    Abstract: A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.
    Type: Application
    Filed: July 24, 2008
    Publication date: February 12, 2009
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Gwang-Young KIM, Jong-Youb KIM, Boung-Lyoul JUNG, Joon-Su JI