Patents by Inventor Boyu Ni

Boyu Ni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210124639
    Abstract: Some embodiments described herein are directed to memory page or bad block monitoring and retirement algorithms, systems and methods for random access memory (RAM). Reliability issues or errors can be detected for multiple memory pages using one or more retirement criterion. In some embodiments, when reliability errors are detected, it may be desired to remove such pages from operation before they create a more serious problem, such as a computer crash. Thus, bad block retirement and replacement mechanisms are described herein.
    Type: Application
    Filed: June 10, 2020
    Publication date: April 29, 2021
    Inventors: Yin Zhang, Nafees Ahmed Abdul, Boyu Ni, Gautham Reddy Kunta, Andrei Khurshudov, Stephen J. Sicola
  • Publication number: 20210064234
    Abstract: In some embodiments, systems, methods, and devices disclosed herein are directed to implementing in-memory computer systems that offer improved performance over conventional computer systems. In some embodiments, the implementations of in-memory computer systems, devices, and methods described herein can function without reliance on conventional storage devices and thus are not subject to the bottleneck in processing speed associated with conventional storage devices. Rather, in some embodiments, the implementations of in-memory computer systems described herein include and/or utilize a processor and memory, wherein the memory is used for mass data storage, without reliance on a conventional hard drive, solid state drive, or any other peripheral storage device. Some embodiments herein relate to non-uniform real-time memory access (NURA) computing, for example on an in-memory computing system.
    Type: Application
    Filed: April 15, 2020
    Publication date: March 4, 2021
    Inventors: Yin Zhang, Nafees Ahmed Abdul, Pradeep Balakrishnan, Boyu Ni, Prasanth Krishnamoorthy
  • Patent number: 10725853
    Abstract: Some embodiments described herein are directed to memory page or bad block monitoring and retirement algorithms, systems and methods for random access memory (RAM). Reliability issues or errors can be detected for multiple memory pages using one or more retirement criterion. In some embodiments, when reliability errors are detected, it may be desired to remove such pages from operation before they create a more serious problem, such as a computer crash. Thus, bad block retirement and replacement mechanisms are described herein.
    Type: Grant
    Filed: December 30, 2019
    Date of Patent: July 28, 2020
    Assignee: Formulus Black Corporation
    Inventors: Yin Zhang, Nafees Ahmed Abdul, Boyu Ni, Gautham Reddy Kunta, Andrei Khurshudov, Stephen J. Sicola
  • Publication number: 20200210272
    Abstract: Some embodiments described herein are directed to memory page or bad block monitoring and retirement algorithms, systems and methods for random access memory (RAM). Reliability issues or errors can be detected for multiple memory pages using one or more retirement criterion. In some embodiments, when reliability errors are detected, it may be desired to remove such pages from operation before they create a more serious problem, such as a computer crash. Thus, bad block retirement and replacement mechanisms are described herein.
    Type: Application
    Filed: December 30, 2019
    Publication date: July 2, 2020
    Inventors: Yin Zhang, Nafees Ahmed Abdul, Boyu Ni, Gautham Reddy Kunta, Andrei Khurshudov, Stephen J. Sicola