Abstract: A transistor die includes a transistor including a control terminal, an output terminal, and a first partial matching circuit. The first partial matching circuit is connected to at least one of the control terminal of the transistor and the output terminal of the transistor, and is configured to tune an input impedance of the transistor die. A packaged device is also provided.

Abstract: A load cell deflasher for the punch and die deflash processing of product from an extrusion includes a load cell pressure transducer interconnected with a punch to sense pressure measurements of the punch against the extrusion at the die and communicate the measurements to a programmable logic controller that controls the extension and retraction of the punch to the die and the structure accommodating pre-punch alignment of the extrusion to the die. The pressure measurements are logged in a trending database of the programmable logic controller. If a pressure measurement exceeds a threshold value, to programmable logic controller can command instruct a positioning actuator of the punch to abort its punch stroke prior to completion.

Abstract: A load cell deflasher for the punch and die deflash processing of product from an extrusion includes a load cell pressure transducer interconnected with a punch to sense pressure measurements of the punch against the extrusion at the die and communicate the measurements to a programmable logic controller that controls the extension and retraction of the punch to the die and the structure accommodating pre-punch alignment of the extrusion to the die. The pressure measurements are logged in a trending database of the programmable logic controller. If a pressure measurement exceeds a threshold value, to programmable logic controller can command instruct a positioning actuator of the punch to abort its punch stroke prior to completion.