Abstract: A process for processor testing includes dividing a memory space into first and second portions and generating first and second sets of test instructions for the respective first and second portion. The first and second sets each include a plurality of counter increment/branch instruction pairs where each branch instruction of the first set branches to a backward instruction location and each branch instruction of the second set branches to a forward instruction location.

Abstract: A process for processor testing includes dividing a memory space into first and second portions and generating first and second sets of test instructions for the respective first and second portion. The first and second sets each include a plurality of counter increment/branch instruction pairs where each branch instruction of the first set branches to a backward instruction location and each branch instruction of the second set branches to a forward instruction location.

Abstract: A process for processor testing includes generating a set of test instructions having a first portion and a second portion. A first branch instruction is randomly generated for the first portion where the first branch instruction branches to a respective instruction in a second portion by a branching location offset. A second branch instruction is randomly generated for the second portion where the second branch instruction branches to a respective instruction in the first portion by the branching location offset. If additional instructions are to be added to the set of test instructions, a value of the branching location offset is incrementing by a predetermined amount.

Abstract: A process for processor testing includes generating a set of test instructions having a first portion and a second portion. A first branch instruction is randomly generated for the first portion where the first branch instruction branches to a respective instruction in a second portion by a branching location offset. A second branch instruction is randomly generated for the second portion where the second branch instruction branches to a respective instruction in the first portion by the branching location offset. If additional instructions are to be added to the set of test instructions, a value of the branching location offset is incrementing by a predetermined amount.

Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.

Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.

Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.

Abstract: In one implementation, processor testing may include the ability to randomly generate a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. Processor testing may also include the ability to randomly generate a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. Processor testing may additionally include the ability to generate a plurality of instructions to increment a counter when each branch instruction is encountered during execution.

Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.

Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.